Coded data generation or conversion – Analog to or from digital conversion – Differential encoder and/or decoder
Reexamination Certificate
1999-01-08
2001-07-03
Young, Brian (Department: 2819)
Coded data generation or conversion
Analog to or from digital conversion
Differential encoder and/or decoder
C341S155000, C341S139000, C341S118000
Reexamination Certificate
active
06255974
ABSTRACT:
BACKGROUND OF THE INVENTION
1. Technical Field
The invention relates to analog-to-digital (A/D) converters, and in particular to a novel sigma-delta A/D type converter having a programmable input reference voltage circuit that enables conversion to be tailored to input voltage amplitudes.
2. Description of Related Art
Analog-to-digital (A/D) conversion is the process of converting a continuous range of analog signals into digital codes, or quantization levels. Increasing the maximum number of digital codes provides greater resolution and more granularity of scale which leads to more accurate digital sampling.
However, AID converters (also know as quantizers) have a maximum sampling rate that limits the speed at which they can perform continuous conversions, and hence the number of digital codes produced. The sampling rate is the number of times per second that the analog signal can be sampled and reliably converted into digital code. The minimum sampling rate must be at least two times the highest frequency of the analog signal sampled to satisfy the Nyquist sampling criterion (two times the highest frequency sampled is termed the “Nyquist rate”). Sampling above the Nyquist rate (oversampling) creates a more accurate digital representation of the analog signal.
There are many types of oversampling A/D conversion methods. So-called “sigma-delta conversion,” one such method, is characterized by oversampling the analog input signal far above the Nyquist rate (e.g., between 16 and 256 times the Nyquist rate) and converting the oversampled signal to a digital signal.
Referring to
FIG. 1
, a conventional, first order, sigma-delta A/D converter arrangement
100
employs an oversampled modulator
112
sampling at a rate well above the Nyquist rate. The modulator
112
comprises an integrator
103
that performs a time domain integration of a sampled difference between an input analog waveform applied at input terminal
101
and a feedback signal produced by D/A converter
105
, produced at summer
102
. The output of integrator
103
is applied to A/D converter
104
, the output of which is applied to a digital filter
106
and also fed back, through D/A converter
105
, to summer
102
.
A/D converter
104
and D/A converter
105
employed in modulator
112
may each be of single bit resolution (e.g., a simple comparator and a pair of switches coupling the comparator output to each of two reference voltages, respectively) or may be multi-bit circuits. The following discussion will assume the latter.
The analog input signal applied to input terminal
101
, is oversampled at a high rate (e.g., greater than 16:1), and differentially summed with the feedback signal at summer
102
to produce an error signal to be applied to integrator
103
. Integrator
103
in turn produces an integrated output signal of 1-bit resolution, converted to a multi-bit digital signal by A/D converter
104
.
This multi-bit digital signal is applied to a digital filer
106
which removes quantization noise to provide an output signal of increased signal-to-noise ratio (SNR), a parameter that is a measure of performance as described in more detail later. The filtered signal is supplied by filter
106
to a decimator
107
that converts the filtered signal to a multi-bit word output at the Nyquist sampling rate (two times the maximum frequency of input bandwidth). Thus, an appropriately sized output multi-bit word is provided by decimator
107
, but reduced from a high sampling rate of relatively low bit resolution to a lower sampling rate having relatively high bit resolution. Hence, digital filter
106
and decimator
107
convert oversampled A/D output signals from analog modulator
112
to a multi-bit Nyquist rate digital word.
A/D converter
104
also supplies its digital output signal to the input of a D/A converter
105
which performs a reconversion to an analog signal generally complementary to the operation of A/D converter
104
. The reconverted analog signal is differentially summed with the input signal to derive the error signal that is integrated with the previous data sample and error values, and converted to an updated digital value.
The error signal applied to integrator
103
reflects not only changes in the input signal and aliasing errors due to the limit of resolution of A/D converter
104
(which will be reflected in the D/A converted signal), but also errors due to deviations from complementarity of the output signals produced by A/D converter
104
and D/A converter
105
. Integrator
103
accumulates all such errors without regard to source. Therefore, to avoid discrepancies in the accumulated error value, the resolution and accuracy of the D/A conversion must be at least as great as that of the final decimated A/D conversion. D/A converter
105
must be capable of processing at least as many bits as the overall A/D converter
100
after filtering and decimation, at an accuracy not less than the incremental value corresponding to the least significant bit (LSB) of the overall A/D converter
100
after filtering and decimation.
The performance of sigma-delta converter is usually expressed in terms of signal-to-noise ratio (SNR), computed by dividing rms (root mean square) input signal power by quantization noise power. For example, for a conventional second order sigma-delta analog section (one having two summers and two integrators):
SNR=M
5
*(30K
2
)/(&Dgr;
2
Π
4
) EQ (1)
where:
M is the oversampling ratio defined as the ratio of the sampling rate to the Nyquist rate;
K is the peak amplitude of the input signal being converted; and
&Dgr; is the range of the quantizer over which conversion is accomplished, and is dependent on a reference voltage (Vref) used in conjunction with the conversion process.
Performance of a conventional second-order sigma-delta converter is depicted graphically in
FIG. 2
with reference to plots
102
,
104
, and
106
(dashed lines). The plots
102
,
104
, and
106
illustrate the relationship between SNR and relative input signal power for oversampling ratios (M) equal to 64, 128, and 256, respectively. With reference voltage held constant, the differences between plots
102
,
104
, and
106
are based on differences in oversampling ratios (M). An increase in oversampling ratio (M) yields increased performance as depicted by peaks
108
a
,
108
b
, and
108
c
with SNR levels that increase successively. For example, the peak SNR amplitude
108
a
for plot
102
(M=64) is approximately at 80 dB, whereas that for plot
106
(M=256) is approximately dB. It should be noted that peak SNR amplitudes for all three plots
102
,
104
,
106
occur at approximately −6 dB on the relative input power axis. This is because the sigma-delta converter generating plots
102
,
104
,
106
use the same constant reference voltage (Vref).
For plots
102
,
104
, and
106
, the range (&Dgr;) is fixed and constant, with a constant reference voltage (Vref). Although range (&Dgr;) is shown only for plot
102
, the ranges (&Dgr;) for plots
104
and
106
increase with an increase in oversampling rates (M) because the range (&Dgr;) is extended to the point where the plot crosses (not shown for
104
,
106
) the relative input power axis. The range (&Dgr;) of plot
102
spans between approximately −85 dB and slightly above zero on the relative input power axis. However, as quantizer saturation, clipping and distortion tend to occur above the −6 dB level, the operating range (&Dgr;) of plot
102
is shown as extending only up to −6 dB, because performance of the sigma-delta converter significantly drops off above that point.
Typically, range (&Dgr;) is also dependent on input power supply voltage level (Vdd). To optimize performance, it is desirable to match input amplitude (K) with the peak SNR level of the quantizer. This peak occurs at −6 dB for plot
102
at
108
a
. Replacing range (&Dgr;) in EQ (1) to determine peak performance yields the following equation (for K≦Vdd/2):
SNR=M
5
*(30K
2
)/((
Vdd
)
2
Danford Elizabeth
Hoke Michael C.
Morizio James C.
Tucker Scott
Burns Doane Swecker & Mathis L.L.P.
Mitsubishi Electric and Electronics USA, Inc
Nguyen John
Young Brian
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