Optics: measuring and testing – For size of particles – By particle light scattering
Patent
1988-11-01
1991-04-16
McGraw, Vincent P.
Optics: measuring and testing
For size of particles
By particle light scattering
356335, G01N 1502
Patent
active
050077376
ABSTRACT:
An intelligent laser diffraction particle sizing system is disclosed. A portion of the primary laser beam is directed by beam splitter into a calibration leg, modulated, and passed through a diffraction reticle. The known diffraction signature of the reticle is then recombined with the primary beam to pass through the particle field. Both the modulated calibration diffraction signature and the portion of the primary beam scattered by the particles are collected by the transform lens and detected at the back focal plane using an X-Y photodiode array. The detector array elements are grouped into variable geometry annular rings. The ring detectors are continuously centered around the beam using feedback from the X-Y position detector which monitors beam deflection.
Auton William G.
McGraw Vincent P.
Pham Hoa
Singer Donald J.
The United States of America as represented by the Secretary of
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