Static information storage and retrieval – Powering – Data preservation
Reexamination Certificate
2006-01-11
2008-03-18
Tan, Vibol (Department: 2819)
Static information storage and retrieval
Powering
Data preservation
C365S226000, C713S310000, C711S102000, C711S154000, C327S143000
Reexamination Certificate
active
07345944
ABSTRACT:
A programmable power-failure-detection circuit in an integrated circuit is provided that permits programmable selection of operating modes that either monitor a power supply of the integrated circuit or provide reduced power consumption from the power supply by disabling the monitoring of the power supply. The programmable power-failure-detection circuit includes at least one configurable memory cell, a monitor circuit, and a switch circuit disposed on the integrated circuit. The monitor circuit is adapted to monitor the power supply of the integrated circuit and generate a power failure signal in response to the power supply failing to comply with a prescribed operating specification. The switch circuit is coupled to the at least one configurable memory cell and the monitor circuit. The switch circuit is adapted to disable the monitor circuit in response to the at least one configurable memory cell.
REFERENCES:
patent: 5362989 (1994-11-01), Hennedy
patent: 5519663 (1996-05-01), Harper et al.
patent: 5583457 (1996-12-01), Horiguchi et al.
patent: 5612892 (1997-03-01), Almulla
patent: 5615162 (1997-03-01), Houston
patent: 5671149 (1997-09-01), Brown
patent: 5682107 (1997-10-01), Tavana et al.
patent: 5712790 (1998-01-01), Ditlow et al.
patent: 5801548 (1998-09-01), Lee et al.
patent: 5825662 (1998-10-01), Trimberger
patent: 5914873 (1999-06-01), Blish, II
patent: 5946257 (1999-08-01), Keeth
patent: 5958026 (1999-09-01), Goetting et al.
patent: 6038386 (2000-03-01), Jain
patent: 6160418 (2000-12-01), Burnham
patent: 6169419 (2001-01-01), De et al.
patent: 6172518 (2001-01-01), Jenkins et al.
patent: 6208171 (2001-03-01), Kumagai et al.
patent: 6384626 (2002-05-01), Tsai et al.
patent: 6466049 (2002-10-01), Diba et al.
patent: 6489804 (2002-12-01), Burr
patent: 6583645 (2003-06-01), Bennett et al.
patent: 6631502 (2003-10-01), Buffet et al.
patent: 6710621 (2004-03-01), Devlin et al.
patent: 6711719 (2004-03-01), Cohn et al.
patent: 6747478 (2004-06-01), Madurawe
patent: 6839888 (2005-01-01), Gupta
patent: 6885563 (2005-04-01), Panella et al.
patent: 6920627 (2005-07-01), Blodget et al.
patent: 6936917 (2005-08-01), Lopata et al.
patent: 6950998 (2005-09-01), Tuan
patent: 6960934 (2005-11-01), New
patent: 7003620 (2006-02-01), Avraham et al.
patent: 7078932 (2006-07-01), Swami
patent: 7080341 (2006-07-01), Eisenstadt et al.
patent: 7109748 (2006-09-01), Liu et al.
patent: 7112997 (2006-09-01), Liang et al.
patent: 7135886 (2006-11-01), Schlacter
patent: 2002/0008542 (2002-01-01), Tsai et al.
patent: 2003/0030326 (2003-02-01), Shenai et al.
patent: 2003/0173993 (2003-09-01), Gupta
patent: 2003/0218478 (2003-11-01), Sani et al.
patent: 2004/0103238 (2004-05-01), Avraham et al.
patent: 2004/0145955 (2004-07-01), Mizuno et al.
patent: 2005/0040851 (2005-02-01), New
patent: 2005/0091547 (2005-04-01), Hanrieder et al.
patent: 2005/0201174 (2005-09-01), Klein
patent: 2005/0237083 (2005-10-01), Bakker et al.
patent: 2006/0053246 (2006-03-01), Lee
patent: 2006/0069851 (2006-03-01), Chung et al.
patent: 2006/0202713 (2006-09-01), Shumarayev
patent: 2007/0001720 (2007-01-01), Li et al.
U.S. Appl. No. 10/606,619, filed Jun. 26, 2003, New et al.
U.S. Appl. No. 10/666,669, filed Sep. 19, 2003 Tuan et al.
U.S. Appl. No. 10/783,216, filed Feb. 20, 2004, Tuan et al.
U.S. Appl. No. 10/783,589, filed Feb. 20, 2004, Look et al.
Allen/Holberg; Chapter 10; “Bandgap Voltage Reference”; Apr. 12, 2000; downloaded on Jan. 3, 2006 from www.ece.utexas.edu/˜holberg/lecture—notes/bandgap.pdf; pp. 1-5.
Microchip Techology Inc.; “Micropower Voltage Supervisors”; MCP102/103/121/131; Copyright 2005; downloaded on Jan. 3, 2006 from ww1.microchip.com/downloads/en/DeviceDoc/21906b.pdf; pp. 1-28, month unknown.
Shin'ichiro Mutoh et al.; “1 -V Power Supply High-speed Digital Circuit Technology with Multithreshold-Voltage CMOS”; IEEE Journal of Solid-State Circuits; Aug. 1995; vol. 30, No. 8, available from IEEE, 3 Park Avenue, 17th Floor, New York, NY 10016-5997; pp. 847-854.
T. Inukai et al.; “Boosted Gate MOS (BGMOS): Device/Circuit Cooperation Scheme to Achieve Leakage-Free Giga-Scale Integration”; IEEE 2000 Custom Integrated Circuits Conference; available from IEEE, 3 Park Avenue, 17th Floor, New York, NY 10016-5997; pp. 409-412, month unknown.
Tadahiro Kuroda et al.; “A 0.9-V, 150-MHz, 10-mW, 4 mm2, 2-D Discrete Cosine Transform Core Processor with Variable Threshold-Voltage (VT) Scheme”; Nov. 1996; vol. 32, No. 11; available from IEEE, 3 Park Avenue, 17th Floor, New York, NY 10016-5997; pp. 1770-1779.
Fatih Hamzaoglu et al.; “Circuit-Level Techniques to Control Gate Leakage for sub-100nm CMOS”; ISLPED; Aug. 12-14, 2002; available from IEEE, 3 Park Avenue, 17th Floor, New York, NY 10016-5997;pp. 60-63.
Lei He; “Power Efficient FPGA: Circuit, Fabrics and CAD Algorithms”; Presentations on Feb. 13, 2004; available from EE Department, UCLA, at http://eda.ee.ucla.edu/; 50 pages.
FPGA 2004 Advance Program; “ACM/SIGDA Eleventh international Symposium on Field Programmable Gate Arrays”; Feb. 22-24, 2004; at Monterey Beach Hotel, Monterey, California,available at http://fpga2004.ece.ubc.ca/; 6 pages.
M. Takahashi et al.; “A 60-mW MPEG4 Video Codec Using Clustered Voltage Scaling with Variable Supply-Voltage Scheme”; Copyright 1998 IEEE; Nov. 1998; vol. 33, No. 11; available from IEEE Journal of Solid-State Circuits, IEEE, 3 Park Avenue, 17th Floor, New York, NY 10016-5997; pp. 1772-1780.
Jae Y. Park and Mark G. Allen; “A Comparison of Micromachined Inductors with Different Magnetic Core Materials”; Copyright 1996 IEEE; 1996 Electronic Components and Technology Conference; pp. 375-381, month unknown.
Thomas D. Burd et al.; “A Dynamic Voltage Scaled Microprocessor System”; Copyright 2000 IEEE; IEEE Journal of Solid-State Circuits, vol. 35, No. 11, Nov. 2000; pp. 1571-1580.
Anthony J. Stratakos et al.; “A Low-Voltage CMOS DC-DC Converter for a Portable Battery-Operated System”; Copyright 1994 IEEE; pp. 619-626, month unknown.
Anthony John Stratakos; “Abstract: High-Efficiency Low-Voltage DC-DC Conversion for Portable Applications,” Chapter 3; “DC-DC Converter Fundamentals”; pp. 42-78, date unknown.
Xilinx, Inc.; “Virtex-II Pro Platform FPGA Handbook”; published Oct. 14, 2002; available from Xilinx, Inc., 2100 Logic Drive, San Jose, California 95124; pp. 19-71.
Xilinx, Inc.; “Spartan-3L Low Power FPGA Family”; Preliminary Product Specification, DS313; Sep. 15, 2005; v. 1.1; available from Xilinx, Inc., 2100 Logic Drive San Jose, California 95124; pp. 1-10.
Intel Corporation; “Intel PXA27x Processor Family Power Requirements”; Application Note; Copyright Intel Corporation 2004; pp. 1-36. Month Unknown.
Xilinx, Inc.; U.S. Appl. No. 10/971,934 by Jenkins IV filed on Oct. 22, 2004 by Xilinx, Inc.
Xilinx, Inc.; U.S. Appl. No. 11/268,265 by Rahman et al. filed on Nov. 4, 2005 by Xilinx, Inc.
Xilinx, Inc.; U.S. Appl. No. 11/325,888 by Tuan filed on Jan. 4, 2006 by Xilinx, Inc.
Xilinx, Inc.; U.S. Appl. No. 11/326,542 by Jacobson et al. filed on Jan. 4, 2006 by Xilinx, Inc.
Xilinx, Inc.; U.S. Appl. No. 11/502,939 by Tuan et al. filed on Aug. 11, 2006 by Xilinx, Inc.
Nowka, Kevin; “A 32-bit PowerPC System-on-a-Chip with Support for Dynamic Voltage Scaling and Dynamic Frequency Scaling”; Nov. 2002, vol. 37. No. 11; IEEE Journal of Solid-State Circuits; Copyright 2002 IEEE; pp. 1441-1447.
Texas Instruments (BenchMARq); bq4011/bq4011Y (32Kx8 Nonvolatile SRAM); Aug. 1993; Copyright 1999; pp. 1-11.
Texas Instruments; “32k x 8 Nonvolatile SRAM (5V, 3.3V)”; bq4011/Y/LY; May 1999 revised May 2007; Copyright 1999-2007; pp. 1-15.
Cartier Lois D.
Maunu LeRoy D.
Tan Vibol
Xilinx , Inc.
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