Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – Analysis of complex waves
Patent
1981-08-10
1985-07-16
Tokar, Michael J.
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
Analysis of complex waves
315377, 324 77R, G01R 2316
Patent
active
045299307
ABSTRACT:
A digitizer circuit for converting analog waveforms displayed upon a CRT screen into digital signals suitable for storage in memory employs a microprocessor to determine, from user-specified parameters, the times at which the output of the CRT vertical amplifier is to be sampled. The user has great flexibility in defining sample resolution and the location of the sample window on the displayed waveform in which the samples are to be taken and is permitted to intensify the sample window on the CRT display before any samples are taken in order to view the sample window in relation to the remainder of a displayed waveform.
REFERENCES:
patent: 3249796 (1966-05-01), Moffitt
patent: 3427536 (1969-02-01), Wainwright
patent: 3816815 (1974-06-01), Schumann
patent: 3836851 (1974-09-01), Schumann
patent: 4041387 (1977-08-01), Dalichow
patent: 4155037 (1979-05-01), Mazur
patent: 4306186 (1981-12-01), Nakazawa
Baud, "Oscilloscope et Retard Numerique", Toute l'Electronique, No. 420, pp. 35-41, (Feb. 1978).
Evel Eddie A.
Fischer Walter A.
Landgraf Robert M.
Risley William B.
Hewlett--Packard Company
Kundrat Douglas A.
Tokar Michael J.
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