Programmable built-in self test method and controller for arrays

Details Programmable built-in self test method and controller for arrays Programmable built-in self test method and controller for arrays

1995-05-31

1997-05-27

Canney, Vincent P.

Excavating

371 225, G06F 1100

Patent

active

056338775

ABSTRACT:
An array built-in self test system has a scannable memory elements and a controller which, in combination, allow self test functions (e.g. test patterns, read/write access, and test sequences) to be modified without hardware changes to the test logic. Test sequence is controlled by logical test vectors, which can be changed, making the task of developing complex testing sequences relatively easy.

REFERENCES:
patent: 4740970 (1988-04-01), Burrows et al.
patent: 5173906 (1992-12-01), Dreibelbis et al.

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