Programmable built-in self-test function for an integrated circu

Details Programmable built-in self-test function for an integrated circu Programmable built-in self-test function for an integrated circu

1995-10-03

1997-06-17

Beausoliel, Jr., Robert W.

Excavating

39518306, 371 225, 371 226, 365201, G06F 1100

Patent

active

056405090

ABSTRACT:
A method and apparatus for providing programmable self-testing in a memory. Registers in the memory are programmed with a sequence of instructions for performing the self-test of the memory. The sequence of instructions is run to perform the self-test of the memory, and the results are checked. The memory includes a clock multiplier which allows the registers to be programmed at a first clock rate, then the memory is tested at a second clock rate which is faster than the first clock rate.

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