Programmable array logic self-checking system

Details Programmable array logic self-checking system Programmable array logic self-checking system

1989-02-06

1992-02-18

Baker, Stephen M.

Excavating

371 224, G01R 3128

Patent

active

050900153

ABSTRACT:
A self checking electronically erasable programmable array logic (EEPAL) that comprises an input receiver, a programmable array, an error detection code storage array, an error detection circuitry, and error signalling circuitry is disclosed. The self checking EEPAL verifies the storage integrity of each cell within the programmable array during the programming of the EEPAL, after completion of programming the EEPAL, and prior to executing the algorithm stored in the EEPAL.

REFERENCES:
patent: 4124899 (1978-11-01), Birkner et al.
patent: 4811078 (1989-03-01), Tigelaar et al.
patent: 4879688 (1989-11-01), Turner et al.
Nuez, J. et al., "Self-Test on a Read-Only Memory", IBM Technical Disclosure Bulletin, vol. 27, No. 9, Feb. 1985, p. 5338.
Millman, J. et al., Microelectronics, McGraw-Hill, 1987, pp. 301-308.

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