Programmable ABIST microprocessor for testing arrays with two lo

Details Programmable ABIST microprocessor for testing arrays with two lo Programmable ABIST microprocessor for testing arrays with two lo

1995-12-14

1997-08-26

Beausoliel, Jr., Robert W.

Excavating

371 225, 365200, G11C 2900

Patent

active

056617321

ABSTRACT:
Computer system element has a VLSI array with redundant areas and an ABIST (Array Built-In Self Test system). The ABIST controller allows self test functions (e.g. test patterns, read/write access, and test sequences) to be used with dual logical views to reduce test time. The ABIST generates pseudo-random address patterns for improved test coverage. A jump-to-third pointer control command enables branching to perform looping after a background has been filled. A data register is divided into multiple sections to enable a Walking/Marching pattern to be executed individually and concurrently in the dual views to further reduce test times.

REFERENCES:
patent: 4740970 (1988-04-01), Burrows et al.
patent: 4841485 (1989-06-01), Prilik et al.
patent: 5138619 (1992-08-01), Fasang et al.
patent: 5173906 (1992-12-01), Dreibelbis et al.
patent: 5258986 (1993-11-01), Zerbe
patent: 5313424 (1994-05-01), Adams et al.
patent: 5386392 (1995-01-01), Cantiant et al.
patent: 5388104 (1995-02-01), Shirotori et al.
patent: 5442641 (1995-08-01), Beranger et al.
patent: 5471482 (1995-11-01), Byers et al.
IBM Journal of Research and Development, "Boundary-Scann Design Principles for Efficient LSSD ASIC Testing", by R. W. Bassett et al. vol. 34, No. 2/3, Mar./May, 1990.
U.S. application No. 08/450,585 filed May 31, 1995, by Turgeon et al, entitled "Programmable Built-in Self Test Method and Controller for Arrays", IBM Docket #P0995004.
U.S. application No. 08/572,843 filed Dec. 14, 1995 by Huott et al, entitled "programmable Computer System Element With Built-In Self Test Method and Apparatus for Repair During Power On", IBM Docket #P0995008.

Affiliated with

Also associated with

Rating

Programmable ABIST microprocessor for testing arrays with two lo does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Programmable ABIST microprocessor for testing arrays with two lo, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Programmable ABIST microprocessor for testing arrays with two lo will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1993364