Program-verify method of non-volatile memory device

Details Program-verify method of non-volatile memory device Program-verify method of non-volatile memory device

2007-12-18

2007-12-18

Nguyen, Tuan T. (Department: 2824)

Static information storage and retrieval

Floating gate

Particular biasing

C365S189070, C365S185230, C365S185170

Reexamination Certificate

active

11400587

ABSTRACT:
A method for programming a non-volatile memory device includes applying a first program-verify voltage to a first word line to determine whether or not memory cells associated with the first word line have been programmed successfully. A second program-verify voltage is applied to a second word line to determine whether or not memory cells associated with the second word line have been programmed successfully. The second program-verify voltage is different from the first program-verify voltage. The first and second word lines are associated with the same word line switching unit.

REFERENCES:
patent: 5754469 (1998-05-01), Hung et al.
patent: 6147190 (2000-11-01), Goodearl et al.
patent: 6853585 (2005-02-01), Lee et al.
patent: 7020017 (2006-03-01), Chen et al.
patent: 7196946 (2007-03-01), Chen et al.
patent: 7218552 (2007-05-01), Wan et al.
patent: 2004/0223371 (2004-11-01), Roohparvar
patent: 2006/0221708 (2006-10-01), Higashitani
patent: 2006/0221709 (2006-10-01), Hemink et al.
patent: 07-029383 (1995-01-01), None
patent: 1997-0060242 (1997-08-01), None
patent: 10-2004-0043363 (2004-05-01), None
patent: 10-2005-0075548 (2005-07-01), None
patent: 10-2006-0014342 (2006-02-01), None

Affiliated with

Also associated with

Rating

Program-verify method of non-volatile memory device does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Program-verify method of non-volatile memory device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Program-verify method of non-volatile memory device will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3894230