Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation
Reexamination Certificate
2006-09-12
2006-09-12
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Performance or efficiency evaluation
C702S108000, C702S109000, C702S183000
Reexamination Certificate
active
07107182
ABSTRACT:
A test support process and a test support program for producing a post-update test pattern when a program under test is updated. When a program under development is updated, a post-update operation description defining details of an operation of a function included in the program under development after the update is acquired. Next, a pre-update operation description having high commonality with the post-update operation description is selected from among pre-update operation descriptions defining details of operations of functions included in the program under development before the update. A pre-update test pattern for an operational test of the selected pre-update operation description is extracted from among pre-update test patterns prepared for operational tests of the program under development before the update. A post-update test pattern for an operational test of the post-update operation description is generated by inheriting at least a portion of the extracted pre-update test pattern.
REFERENCES:
patent: 6502210 (2002-12-01), Edwards
patent: 6763490 (2004-07-01), Krech et al.
patent: 2000-267886 (2000-09-01), None
patent: 2000-305812 (2000-11-01), None
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English Language Abstract JP 06-250884 A dated Sep. 9, 1994.
Office Action issued Sep. 13, 2005 by the Japanese Patent Office regarding Application No.: 2002-278806.
Fujikawa Ryoko
Hasegawa Masanori
Ito Goro
Katayama Tetsuya
Kawashima Satoru
Barlow John
Cherry Stephen J.
Fujitsu Limited
Staas & Halsey , LLP
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