Profilometry scanner mechanism

Measuring and testing – Surface and cutting edge testing – Roughness

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Details

33552, 33546, 33554, G01B 520, G01B 1124, G01B 2120, G01B 2130

Patent

active

052458644

ABSTRACT:
A mechanism for scanning the contour of a tri-dimensional body including control circuitry for processing and storing the pattern data obtained. The contour pattern is measured by using contour follower members that radially slide between the two arms of a scan rotor assembly that is driven by a reference step motor. Coaxially aligned phase disks are rotably and slidably mounted over outer slots on the outer periphery of the arms and a linkage mechanism is pivotally mounted on one end to a predetermined point in the phase disk and the other end to the contour follower member. The phase disks are slowed down by frictional force applied to the phase disks and this slowing down force is overcome by the contour follower once it comes in contact with the reference body. The phase angle difference between the phase disks and the referenced step motor rotation is measured, processed and stored for subsequent pattern matching with the use of a microprocessor.

REFERENCES:
patent: 2775039 (1956-12-01), Price
patent: 2835983 (1958-05-01), Razdow
patent: 2854756 (1958-10-01), Aller
patent: 3553370 (1971-01-01), Rosenheck
patent: 4133204 (1979-01-01), Mittleman
patent: 4758093 (1988-07-01), Stern et al.
Pratt and Whitney Sigmatic Multi-Dimension Gaging Machines (The Modern, Low-Cost Answer to Production Gaging Problems; pp. 1-12; published by Dec. 1958 (8-55-5C Circular No. 592).

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