Optics: measuring and testing – Shape or surface configuration – Triangulation
Reexamination Certificate
2005-03-22
2005-03-22
Pham, Hoa Q. (Department: 2877)
Optics: measuring and testing
Shape or surface configuration
Triangulation
C356S623000, C250S236000
Reexamination Certificate
active
06870631
ABSTRACT:
A system and method for measuring the profile of an external surface of a part is provided. The system includes a source of light that directs light onto a region of the external surface of the part. The system also includes a linear, light-sensitive sensor, and a lens used to image locations within the region onto the sensor. The source of light and the sensor are located substantially within the same plane such that the sensor detects substantially only light scattered, diffracted, or reflected from the region and travelling substantially within the plane. The system additionally includes a re-positionable mirror that re-directs the light emitted from the source of light to the plurality of locations within the region and re-directs light scattered, diffracted, or reflected from the plurality of locations within the region to the lens and the sensor. An automatic gain control system which controls the output power of the source of light to thereby avoid saturating the exposure of the sensor may also be included in the above system. Further, a spring which functions as a low-pass filter may be used to couple the motor to the shaft of the rotating mirror. In another embodiment, a re-positionable polygon mirror system comprising standoffs with tangs which restrict the outside reflecting mirror surfaces to pre-aligned planes during rotation of the polygon mirror system is disclosed. A fail-safe eye safety technique is also disclosed which controls the power to the source of light. Even further, an optical scanning system is disclosed which utilizes bi-cell photo-detectors to determine the angular position of the source of light with high precision.
REFERENCES:
patent: 4277141 (1981-07-01), Kleiber
patent: 4498778 (1985-02-01), White
patent: 4567347 (1986-01-01), Ito et al.
patent: 4628469 (1986-12-01), White
patent: 4639140 (1987-01-01), Lerat
patent: 4759593 (1988-07-01), Kessler
patent: 4761072 (1988-08-01), Pryor
patent: 4863268 (1989-09-01), Clarke et al.
patent: 4880299 (1989-11-01), Hamada
patent: 4932784 (1990-06-01), Danneskiold-Samsoe
patent: 4943157 (1990-07-01), Reding
patent: 4979816 (1990-12-01), White
patent: 5004929 (1991-04-01), Kakinoki et al.
patent: 5149963 (1992-09-01), Hassler, Jr.
patent: 5151608 (1992-09-01), Torii et al.
patent: 5157486 (1992-10-01), Baird et al.
patent: 5171984 (1992-12-01), van Rosmalen
patent: 5177556 (1993-01-01), Rioux
patent: 5245182 (1993-09-01), Van Rosmalen et al.
patent: 5450219 (1995-09-01), Gold et al.
patent: 5489985 (1996-02-01), Mochida et al.
patent: 5550668 (1996-08-01), Appel et al.
patent: 5617133 (1997-04-01), Fisli
patent: 5739912 (1998-04-01), Ishii
patent: 5754215 (1998-05-01), Kataoka et al.
patent: 5777311 (1998-07-01), Keinath et al.
patent: 5789743 (1998-08-01), Van Rosmalen
patent: 5828479 (1998-10-01), Takano et al.
patent: 5850289 (1998-12-01), Fowler et al.
patent: 5864394 (1999-01-01), Jordan, III et al.
patent: 5880846 (1999-03-01), Hasman et al.
patent: 6046801 (2000-04-01), Liu et al.
patent: 6151564 (2000-11-01), Vescovi et al.
patent: 6205406 (2001-03-01), Hahn et al.
patent: 0 377 973 (1990-07-01), None
patent: 0 618 472 (1994-10-01), None
patent: 03 198650 (1991-08-01), None
A Real-time Optical Profile Sensor For Robot Arc Welding, Oomen et al, Proceedings Of The SPIE, vol. 449, Intelligent Robots: RoViSeC3, 1983 pp. 62-71.
Science Applications International Corporation, “Recent Applications Of Laser Line Scan Technology And Data Processing”, SAIC Science and Technology Trends, 1998, pp., 190-195.
“Motor/Polygon Speed Stability Definition And Measurement”, Lincoln Laser Scanning Systems, 1993, Appl. Note #214, pp., 1-4.
Clary Thomas R.
Greenberg Heath M.
Johnston Kyle S.
Lock Tomas E.
Nelson Spencer G.
Esserman Matthew J.
McNichol, Jr. William J.
Metron Systems, Inc.
Pham Hoa Q.
LandOfFree
Profiling of a component having reduced sensitivity to... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Profiling of a component having reduced sensitivity to..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Profiling of a component having reduced sensitivity to... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3448152