Image analysis – Pattern recognition – Feature extraction
Patent
1996-08-28
2000-08-01
Chang, Jon
Image analysis
Pattern recognition
Feature extraction
382282, 345419, 345433, G06K 946
Patent
active
060978406
ABSTRACT:
To identify the shape of an object on the basis of a two-dimensional image including the image of the object, an image of notice is extracted from the two-dimensioinal image as a part thereof and including the profile of the object, and on the basis of the image information of the extracted image of notice, the image division line, being the line of specific line kind defined by function, substantially matching with the profile of the object in the image of notice is assessed.
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Shiitani Shuichi
Watanabe Masaki
Chang Jon
Fujitsu Limited
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