Production test technique for RF circuits using embedded...

Details Production test technique for RF circuits using embedded... Production test technique for RF circuits using embedded...

2006-05-18

2009-06-30

He, Amy (Department: 2831)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S763010

Reexamination Certificate

active

07554335

ABSTRACT:
A single test stimulus and a simple test configuration with embedded envelope detectors are used to estimate all the specification values of interest for an RF circuit under test in an integrated circuit chip. Envelope detectors are deployed as sensors inside the circuit under test. Where more than one circuit is in an RF device in the integrated circuit, each RF circuit in the device may have its own envelope detector. A signal having, for example, time-varying envelopes is used as an optimized test stimulus. The test uses the time-varying and low frequency envelope of the test response. The circuit's response under test to the optimized test stimulus has features highly correlated with the specifications of interest. The test stimulus is optimized for a set of training circuits, and each training circuit in the set is selected to provide one of a spectrum of test responses to the stimulus.

REFERENCES:
patent: 7006939 (2006-02-01), Voorakaranam et al.

Affiliated with

Also associated with

Rating

Production test technique for RF circuits using embedded... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Production test technique for RF circuits using embedded..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Production test technique for RF circuits using embedded... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4077073