Metal working – Barrier layer or semiconductor device making – Barrier layer device making
Reexamination Certificate
2004-07-13
2008-12-30
Chen, Jack (Department: 2893)
Metal working
Barrier layer or semiconductor device making
Barrier layer device making
Reexamination Certificate
active
07470291
ABSTRACT:
At least one conductive layer is formed by applying paste mainly containing metal on at least one insulating sheet. At least one sintered body is provided by firing the at least one insulating sheet having the at least one conductive layer formed thereon. The amount of the metal contained in the at least one conductive layer of the at least one sintered body is detected. A sintered body is selected from the at least one sintered body based on the detected amount of the metal. An outer electrode is formed on the selected sintered body, thus providing a ceramic electronic device. This method allows a defective to be detected in an early stage of manufacturing processes, hence providing a ceramic electronic device to be manufactured efficiently.
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Nagai Atsuo
Otsuki Jun
Chen Jack
McDermott Will & Emery LLP
Panasonic Corporation
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