Data processing: measuring – calibrating – or testing – Calibration or correction system – Signal frequency or phase correction
Reexamination Certificate
2007-08-14
2007-08-14
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Calibration or correction system
Signal frequency or phase correction
C340S010520, C702S085000, C702S072000, C702S075000, C324S763010, C324S764010, C324S076490, C438S014000, C438S017000, C438S018000, C455S041200, C455S151200
Reexamination Certificate
active
11145016
ABSTRACT:
A radio frequency ID tag, very small in size and with an onboard antenna, is manufactured, tested and applied cost-efficiently. The transmit frequency for the tag is set during manufacture approximately, within a selected range, in a gross tuning step. A second tuning step fine tunes each tag by RF communication to set values of capacitance, resistance, etc., and this can be at the point of application of the tags. Other aspects include burning a randomly-selected value in the RF ID chip during manufacture to impose a random time delay for tag response (rather than having a random generator on the chip itself); structural testing of a large number of tags on a wafer using on-wafer interconnects and a special onboard sequencer test die; and production of the tag so as to be tunable to different frequency ranges.
REFERENCES:
patent: 5838163 (1998-11-01), Rostoker et al.
patent: 6480699 (2002-11-01), Lovoi
patent: 6825683 (2004-11-01), Berndt et al.
patent: 2003/0112128 (2003-06-01), Littlechild et al.
patent: 2005/0121898 (2005-06-01), Laackmann
patent: 2006/0125507 (2006-06-01), Hyde et al.
Baron Bernard
Bolander Jarie G.
Jarvis Neil
Lee Christopher J.
Lovoi Paul A.
Barlow John
Freiburger Thomas M.
Kundu Sujoy
Tagent Corporation
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