Product defect detection using thermal ratio analysis

Details Product defect detection using thermal ratio analysis Product defect detection using thermal ratio analysis

1990-09-14

1991-07-16

Cuchlinski, Jr., William A.

Radiant energy

Infrared-to-visible imaging

250332, 358106, 374 4, 374 5, 382 1, 382 43, H01L 3100

Patent

active

050327275

ABSTRACT:
A method and apparatus for indicating defects in manufactured products employs, instead of the conventional thermal image subtraction, "thermal ratio analysis", which involves ratios of thermal data and their analysis including statistical analysis. Various techniques for "image" enhancement and for suppression of known artifacts are employed to facilitate the decision as to when a defect is detected. The thermal ratio analysis technique is particularly useful for detecting hidden defects in electronic circuitry, such as integrated circuits.

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C. G. Masi, "What Can Thermal Imaging do for You?", Test and Measurement World, May, 1988.
C. G. Masi, "Finding Board Faults with Thermal Imaging", Test and Measurement World, Mar., 1989, pp. 100, 111 and 112.
"Thermal Imager Product Survey", Test and Measurement World, Mar., 1989, pp. 113-115, 120.
Hugh Danaher, "Thermography-Understanding the Expanded Role of Thermal Imagers in Production Testing", Evaluation Engineering, Dec., 1988, pp. 74, 75, 77-79.

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