Processor for pattern data, measured process information, and im

Details Processor for pattern data, measured process information, and im Processor for pattern data, measured process information, and im

1989-09-20

1992-06-30

Razavi, Michael

Image analysis

Histogram processing

For setting a threshold

382 16, 382 42, 382 48, 382 56, 36441317, 3642219, 3642752, 3649754, 318596, G06K 900, G06K 15336, G06K 1920, G06F 1500

Patent

active

051270633

ABSTRACT:
In order to easily identify a pattern of time-series state changes based on measured information so as to facilitate representation of edge portions of an image, features extracted in a form of expansion coefficients of polynomials from the measured information are translated into abstract expressions so as to detect from the measured information significant control information which has not been used in the conventional technology, and features extracted in a form of expansion coefficients from brightness changes in the vicinity of each pixel constituting image data are translated into abstract expression.

REFERENCES:
patent: 4326252 (1982-04-01), Kohno et al.
patent: 4630309 (1986-12-01), Karow
patent: 4648120 (1987-03-01), Chittineni
patent: 4771474 (1988-09-01), Takashima et al.
patent: 4884225 (1989-11-01), Fogarty et al.
patent: 4918611 (1990-04-01), Shyu et al.

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