Processor circuit with testing device

Details Processor circuit with testing device Processor circuit with testing device

1997-06-06

1998-11-24

Tu, Trinh L.

39518316, G06F 1100

Patent

active

058419683

ABSTRACT:
A processor circuit configuration with a control processor and circuit blocks which are connected to the control processor through a bus. A testing device includes test decoders which are each assigned to a respective one of the circuit blocks. The test decoders receive control signals from the control processor and from a test logic, which is also connected to the bus, for controlling the circuit blocks. In a test mode, the test logic selects a given circuit block, deactivates all other circuit blocks, transmits test data through the bus to the given circuit block, activates the control processor, receives test data sent through the bus from the given circuit: block, evaluates the test data, and issues a corresponding result signal. The processing of the test data in the given circuit block is determined by the control processor.

REFERENCES:
patent: 4433413 (1984-02-01), Fasang
patent: 4541094 (1985-09-01), Stiffler et al.
patent: 4546473 (1985-10-01), Eichelberger et al.
patent: 5157781 (1992-10-01), Harwood et al.
patent: 5258985 (1993-11-01), Spence et al.
patent: 5416783 (1995-05-01), Broseghini et al.
A Tutorial on Built-In-Self-Test, Part 1: Principles, (Agrawal et al.), dated Mar. 10, 1993, pp. 73-82.
Realization of an Efficient Design Verification Test Based on a Microinstruction Controlled Self-Test, Proceedings of the International Test Conference, Washington, (Yasuyuki Nozuyama), dated Sep. 10-14, 1990, No. 1, Conf. 21, Institute of electrical and electronics engineers, dated Sep. 10, 1990, pp. 327-336.
Self-Test of Processor-chips, (Ritter et al.), dated Mar. 30, 1990, Elekronik, pp. 38-40, vol. 39, No. 7 (Not in English).

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