Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Chemical analysis
Patent
1996-12-11
1999-03-16
Peeso, Thomas
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Chemical analysis
73290R, 73291, 340618, 340620, H01Q 1514
Patent
active
058842314
ABSTRACT:
A method and apparatus for processing a time domain reflectometry (TDR) signal having a plurality of reflection pulses to generate a valid output result corresponding to a process variable in a vessel. The method includes the steps of establishing an initial boundary signal before the process variable is locates in the vessel, storing the initial boundary signal, detecting the TDR signal, and determining a baseline signal by subtracting the initial boundary signal from the TDR signal. The method also includes the steps of establishing a signal pattern having a time range based on the width of reflection pulses in the baseline signal, comparing the baseline signal to the signal pattern until a reflection pulse in the baseline signal matches the signal pattern, determining a maximum value of the reflection pulse that matches the signal pattern, and calculating an output result based on the maximum value.
REFERENCES:
patent: 3832900 (1974-09-01), Ross
patent: 3922914 (1975-12-01), Fuchs
patent: 3995212 (1976-11-01), Ross
patent: 4135397 (1979-01-01), Krake
patent: 4322832 (1982-03-01), Sartorius
patent: 5323361 (1994-06-01), Ella et al.
patent: 5345471 (1994-09-01), McEwan
patent: 5361070 (1994-11-01), McEwan
patent: 5376888 (1994-12-01), Hook
patent: 5391839 (1995-02-01), Lang et al.
patent: 5420517 (1995-05-01), Skaling et al.
patent: 5457990 (1995-10-01), Oswald et al.
patent: 5609059 (1997-03-01), McEwan
patent: 5656774 (1997-08-01), Nelson et al.
Steven Arcone, "Conductivity limitations in single-reflection time-domain reflectometry ", J. Phys. E. Sci. Instrum. 19 (1986), pp. 1067-1069.
Holt et al. "Digital Concepts & Applications", Saunders College Publishing, p. 225, date unknown.
Perdue Kenneth Lee
Swager Richard B.
Endress & Hauser GmbH & Co.
Peeso Thomas
LandOfFree
Processor apparatus and method for a process measurement signal does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Processor apparatus and method for a process measurement signal, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Processor apparatus and method for a process measurement signal will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-826985