Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2007-04-05
2009-10-27
Nguyen, Vincent Q (Department: 2831)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S548000
Reexamination Certificate
active
07609072
ABSTRACT:
A method of conditioning tantalum capacitors on printed wire assemblies is disclosed. According to the method, each of the capacitors on an assembly is subjected to the same conditioning level during testing. To condition the tantalum capacitors, surge currents are induced in the capacitors in a controlled manner as a way of aging the capacitors so that they can be used without de-rating rating with low failure rates. The level of voltage, timing and current levels are set by circuitry used to perform the testing. The same circuits that are used with the capacitors in a system application are also used for the tantalum capacitor test circuit during the conditioning process.
REFERENCES:
patent: 3268809 (1966-08-01), Meyer
patent: 3850764 (1974-11-01), Herczog et al.
patent: 3930993 (1976-01-01), Best et al.
patent: 3943439 (1976-03-01), Raymond
patent: 4067786 (1978-01-01), Hilbert et al.
patent: 4160284 (1979-07-01), Deffeyes et al.
patent: 4164455 (1979-08-01), Aronson et al.
patent: 4184112 (1980-01-01), Cox
patent: 4280270 (1981-07-01), Escher et al.
patent: 4330777 (1982-05-01), McDuff
patent: 4450049 (1984-05-01), Nakata et al.
patent: 4706375 (1987-11-01), Bernard et al.
patent: 4781802 (1988-11-01), Fresia
patent: 5882719 (1999-03-01), Creasi, Jr.
patent: 6054864 (2000-04-01), Butts
patent: 6127828 (2000-10-01), Kamitani
patent: 6687173 (2004-02-01), Kang et al.
patent: 6706059 (2004-03-01), Harguth et al.
patent: 6761728 (2004-07-01), Harguth et al.
patent: 2001/0047190 (2001-11-01), Harguth et al.
patent: 2002/0095186 (2002-07-01), Harguth et al.
patent: 2003/0020486 (2003-01-01), Tsuchiya
patent: 2004/0098058 (2004-05-01), Harguth et al.
patent: 2004/0186520 (2004-09-01), Harguth et al.
patent: 2004/0225327 (2004-11-01), Norton et al.
patent: 1 129 003 (1968-10-01), None
patent: 58 102173 (1983-06-01), None
patent: WO 02/25294 (2002-03-01), None
European Search Report in corresponding Application No. 08154016.3-2216, dated Jul. 30, 2008.
Greenleaf Todd David
Ritter Allen Michael
General Electric Company
Nguyen Vincent Q
Nixon & Vanderhye P.C.
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