Optics: measuring and testing – By monitoring of webs or thread – For flaws or imperfections
Patent
1978-08-09
1981-03-03
Corbin, John K.
Optics: measuring and testing
By monitoring of webs or thread
For flaws or imperfections
250563, 356237, G01N 2132
Patent
active
042537681
ABSTRACT:
This invention is a system of automatically classifying defects both for sorting defective products (metallic surfaces, especially tube surfaces) as to the reworking operation required for correcting the defect, and for classifying the defect as to the preceding manufacturing operation which is the most probable cause of that defect and sending a signal to that operation to provide for adjustments to minimize future defects. The system uses a source of electromagnetic radiation (typically a laser beam which is scanned across the surface) and at least two sensors (adjusted such that the radiation is reflected from a defect-free surface principally received by one of the sensors but that there is a measured amount of radiation in the other sensor). An average signal of the principal sensor is developed as a function of scan position. Threshold circuitry detects when the ratio of sensor signal to average signal varies by a predetermined amount. Special circuitry is used to detect the essentially simultaneous occurrence of at least two different preselected combinations of signal variations to identify the type of defect.
REFERENCES:
patent: 2975293 (1955-02-01), Kruse, Jr. et al.
patent: 3749496 (1973-07-01), Heitanen et al.
patent: 3781117 (1973-12-01), Laycak et al.
patent: 3781531 (1973-12-01), Baker
patent: 3804534 (1974-04-01), Clarke
patent: 3812373 (1974-05-01), Hosoe et al.
patent: 3834822 (1974-09-01), Stapleton et al.
patent: 3843890 (1974-10-01), Anthony, Jr. et al.
patent: 3900265 (1975-08-01), Merlen et al.
patent: 3920970 (1975-11-01), Slaker
patent: 3984189 (1976-10-01), Seki et al.
Kennedy Paul G.
Miller Robert C.
Sarkozi Miklos
Yaroshuk Nicholas
Arnold Bruce Y.
Corbin John K.
Stoltz R. A.
Westinghouse Electric Corp.
LandOfFree
Processing system for detection and the classification of flaws does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Processing system for detection and the classification of flaws , we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Processing system for detection and the classification of flaws will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-77382