Semiconductor device manufacturing: process – Including control responsive to sensed condition
Reexamination Certificate
2006-08-29
2006-08-29
Coleman, W. David (Department: 2823)
Semiconductor device manufacturing: process
Including control responsive to sensed condition
C118S733000, C257SE21532
Reexamination Certificate
active
07098045
ABSTRACT:
A processing method is performed for processing a workpiece such as a semiconductor wafer. The processing method utilizes an apparatus comprising a cover for covering a portion of a surface, to be processed, of a workpiece, a process chamber formed by the cover and the surface, to be processed, of the workpiece, and a sealing portion provided between the cover and the surface of the workpiece for sealing the process chamber.
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Nagayama Masami
Noji Nobuharu
Ono Koji
Saito Mutsumi
Sobukawa Hiroshi
Coleman W. David
Ebara Corporation
Wenderoth , Lind & Ponack, L.L.P.
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