Semiconductor device manufacturing: process – Chemical etching
Reexamination Certificate
2007-07-10
2007-07-10
Wells, Nikita (Department: 2881)
Semiconductor device manufacturing: process
Chemical etching
C438S720000, C438S745000
Reexamination Certificate
active
11107885
ABSTRACT:
A temporal protection layer is employed to a wafer backside for use of micro-electro-mechanical systems (MEMS). The formation of the temporal protection layer prevents the wafer backside from scratch in process of transferring system for IC manufacturers. With regard to low cost and easy forming and removing, an oxide layer is used as the temporal protection layer. The throughput and yield rate of the wafer production are improved by the use of the temporal protection layer.
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Hsu Chih-Chia
Huang Yin-Fu
Lee Cheng-Hsiung
Lee Lung-An
Tseng Kuo-Pang
Macronix International Co. Ltd.
Souw Bernard
Wells Nikita
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