Coating apparatus – Gas or vapor deposition
Reexamination Certificate
2011-08-23
2011-08-23
Zervigon, Rudy (Department: 1716)
Coating apparatus
Gas or vapor deposition
C156S345100, C251S331000, C251S335100
Reexamination Certificate
active
08002894
ABSTRACT:
In a processing apparatus including a diaphragm valve provided on a process gas discharge line for discharging a process gas from a processing chamber and configured to control the internal pressure of the processing chamber by adjusting the opening of the diaphragm valve, an antistatic agent source is connected to the process gas discharge line at a position upstream of the diaphragm valve. Damage of a diaphragm valve element due to spark discharge resulted from electric charge generated by friction between the gas flowing through the diaphragm valve and the diaphragm valve element can be prevented.
REFERENCES:
patent: 4795497 (1989-01-01), McConnell et al.
patent: 6176265 (2001-01-01), Takahashi et al.
patent: 6869499 (2005-03-01), Toshima et al.
patent: 7086410 (2006-08-01), Chouno et al.
patent: 2004/0002224 (2004-01-01), Chono et al.
patent: 2006/0079096 (2006-04-01), Nakamori et al.
patent: 2006/0099339 (2006-05-01), Hashizume
patent: 1 077 473 (2001-02-01), None
patent: 2000-262874 (2000-09-01), None
patent: 2003-332322 (2003-11-01), None
patent: 2004-273553 (2004-09-01), None
patent: 02/09894 (2002-02-01), None
European Search Report.
Japanese Office Action issued on Sep. 22, 2010 for Application No. 2006-154494 with English translation.
Higashijima Jiro
Maeda Kousuke
Okamura Naoyuki
Smith , Gambrell & Russell, LLP
Tokyo Electron Limited
Zervigon Rudy
LandOfFree
Processing apparatus and processing method does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Processing apparatus and processing method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Processing apparatus and processing method will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2791758