Processing apparatus

Etching a substrate: processes – Nongaseous phase etching of substrate – Substrate is multilayered

Reexamination Certificate

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C134S001300, C134S113000, C134S036000

Reexamination Certificate

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08043521

ABSTRACT:
A processing method of subjecting at least two stacked films, which comprise a first film and a second film of a target object to be processed, to a removing process by wet etching comprises bringing a first process liquid into contact with the first film of the target object, thereby etching the first film, determining whether the first film has been removed or not, switching the first process liquid to a second process liquid differing in a condition from the first process liquid when it has been determined that the first film has been removed, and bringing the second process liquid into contact with the second film, thereby etching the second film.

REFERENCES:
patent: 6178975 (2001-01-01), Aoki
patent: 6326313 (2001-12-01), Couteau et al.
patent: 6510859 (2003-01-01), Kamikawa
patent: 6653206 (2003-11-01), Yanagita et al.
patent: 6686239 (2004-02-01), Nam et al.
patent: 6979655 (2005-12-01), Niuya et al.
patent: 2002/0155709 (2002-10-01), Toshima et al.
patent: 2006/0060232 (2006-03-01), Tsurusaki et al.
patent: 2006/0088959 (2006-04-01), Gale
patent: 2006/0163205 (2006-07-01), Niuya et al.
patent: 2009/0011523 (2009-01-01), Gale
patent: 09-143761 (1997-06-01), None
patent: 2004-179583 (2004-06-01), None
patent: 2004179583 (2004-06-01), None
Machine Generated English Translation of JP 2004-179583, published Jun. 24, 2004.
Japanese Office Action; Japanese patent Application No. 2004-304471; dated Dec. 8, 2009.

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