Optics: measuring and testing – Optical pyrometers
Patent
1982-06-23
1985-02-12
McGraw, Vincent P.
Optics: measuring and testing
Optical pyrometers
374126, G01J 558, G01J 532
Patent
active
044987650
ABSTRACT:
A process for the remote measurement of the emissivity .epsilon. of a body (1) with relatively smooth surface, consisting: in making, with a detector (6) and a converter (9), a first measurement A of the luminance at a point M on the surface at an emission angle .theta., the thermal radiation (2) on which the measurement is made being polarized (at 4) in a first direction with respect to the emission plane, in making a second measurement B of the luminance at the same point and at the same emission angle .theta., the thermal radiation being polarized in a second direction, different from the first one, finally, in determining the emissivity ##EQU1## .theta..sub.1 being the angle of the axis of the polarizer for A and .theta..sub.2 being the angle of the axis of the polarizer for B, measured with respect to a polarization perpendicular to the emission plane.
REFERENCES:
patent: 3422678 (1969-01-01), Murray
patent: 3462224 (1969-08-01), Woods et al.
patent: 4020695 (1977-05-01), Roney
Foley, The Review of Scientific Instruments, High Speed Optical Pyrometer, vol. 41, No. 6, pp. 827-834, Jan. 15, 1970.
McGraw Vincent P.
Turner Samuel A.
Universite Paris X - Paris
LandOfFree
Processes for the remote measurement of the emissivity and/or th does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Processes for the remote measurement of the emissivity and/or th, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Processes for the remote measurement of the emissivity and/or th will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1386991