Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching
Reexamination Certificate
2008-06-03
2008-06-03
Deo, Duy-Vu N (Department: 1792)
Semiconductor device manufacturing: process
Chemical etching
Vapor phase etching
C438S710000, C438S714000, C438S725000
Reexamination Certificate
active
07381651
ABSTRACT:
Processes for monitoring the levels of oxygen and/or nitrogen in a substantially oxygen and nitrogen-free plasma ashing process generally includes monitoring the plasma using optical emission. An effect produced by the low levels of oxygen and/or nitrogen species present on other species generally abundant in the plasma is monitored and correlated to amounts of oxygen and nitrogen present in the plasma. This so-called “effect detection” process monitors perturbations in the spectra specifically associated with species other than nitrogen and/or oxygen due to the presence of trace amounts of oxygen and/or nitrogen species and is used to quantitatively determine the amount of oxygen and/or nitrogen at a sensitivity on the order of 1 part per million and potentially 1 part per billion.
REFERENCES:
patent: 4776690 (1988-10-01), Quimby
patent: 5708957 (1998-01-01), Chuang et al.
patent: 6638875 (2003-10-01), Han et al.
patent: 6864109 (2005-03-01), Chang et al.
patent: 6951823 (2005-10-01), Waldfried et al.
patent: 2002/0140932 (2002-10-01), Satou et al.
patent: 2004/0235299 (2004-11-01), Srivastava et al.
patent: 2004/0238123 (2004-12-01), Becknell et al.
patent: 2005/0019964 (2005-01-01), Chang et al.
Becknell Alan F.
Buckley Thomas J.
Sakthivel Palanikumaran
Axcelis Technologies Inc.
Cantor & Colburn LLP
Deo Duy-Vu N
LandOfFree
Processes for monitoring the levels of oxygen and/or... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Processes for monitoring the levels of oxygen and/or..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Processes for monitoring the levels of oxygen and/or... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2802901