Processes for forming isolation structures for integrated...

Semiconductor device manufacturing: process – Formation of electrically isolated lateral semiconductive... – Grooved and refilled with deposited dielectric material

Reexamination Certificate

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C257SE21546

Reexamination Certificate

active

07939420

ABSTRACT:
Processes for forming isolation structures for semiconductor devices include forming a submerged floor isolation region and a filed trench which together enclose an isolated pocket of the substrate. One process aligns the trench to the floor isolation region. In another process a second, narrower trench is formed in the isolated pocket and filled with a dielectric material while the dielectric material is deposited so as to line the walls and floor of the first trench. The substrate does not contain an epitaxial layer, thereby overcoming the many problems associated with fabricating the same.

REFERENCES:
patent: 4269636 (1981-05-01), Rivoli et al.
patent: 4454647 (1984-06-01), Joy et al.
patent: 4478655 (1984-10-01), Nagakubo et al.
patent: 4642883 (1987-02-01), Sakurai et al.
patent: 4655875 (1987-04-01), Wada et al.
patent: 4819052 (1989-04-01), Hutter
patent: 4980747 (1990-12-01), Hutter et al.
patent: 5157419 (1992-10-01), Matsumoto et al.
patent: 5324973 (1994-06-01), Sivan
patent: 5374569 (1994-12-01), Yilmaz et al.
patent: 5386136 (1995-01-01), Williams et al.
patent: 5410175 (1995-04-01), Kyomasu et al.
patent: 5420061 (1995-05-01), Manning
patent: 5485027 (1996-01-01), Williams et al.
patent: 5506431 (1996-04-01), Thomas
patent: 5525824 (1996-06-01), Himi et al.
patent: 5557135 (1996-09-01), Hashimoto
patent: 5668397 (1997-09-01), Davis et al.
patent: 5684305 (1997-11-01), Pearce
patent: 5807783 (1998-09-01), Gaul et al.
patent: 5883413 (1999-03-01), Ludikhuize
patent: 5892264 (1999-04-01), Davis et al.
patent: 5914523 (1999-06-01), Bashir et al.
patent: 5986863 (1999-11-01), Oh
patent: 5993677 (1999-11-01), Biasse et al.
patent: 6013936 (2000-01-01), Colt
patent: 6130458 (2000-10-01), Takagi et al.
patent: 6144086 (2000-11-01), Brown et al.
patent: 6163052 (2000-12-01), Liu et al.
patent: 6171982 (2001-01-01), Sato
patent: 6225674 (2001-05-01), Lim et al.
patent: 6316336 (2001-11-01), Blanchard
patent: 6331456 (2001-12-01), Wu
patent: 6383892 (2002-05-01), Colt
patent: 6559505 (2003-05-01), Fallica
patent: 6657262 (2003-12-01), Patti
patent: 6740958 (2004-05-01), Nakazato et al.
patent: 6855985 (2005-02-01), Williams et al.
patent: 6900091 (2005-05-01), Williams et al.
patent: 6943426 (2005-09-01), Williams et al.
patent: 7009271 (2006-03-01), Thurgate et al.
patent: 7049663 (2006-05-01), Wang
patent: 7176548 (2007-02-01), Williams et al.
patent: 7183610 (2007-02-01), Pattanayak et al.
patent: 7268045 (2007-09-01), Hower et al.
patent: 7576388 (2009-08-01), Wilson et al.
patent: 2001/0000288 (2001-04-01), Oh
patent: 2001/0013636 (2001-08-01), Dunn et al.
patent: 2001/0015459 (2001-08-01), Watanabe et al.
patent: 2002/0008299 (2002-01-01), Leonardi
patent: 2002/0079555 (2002-06-01), Okawa et al.
patent: 2002/0084506 (2002-07-01), Voldman et al.
patent: 2003/0057498 (2003-03-01), Yamashita
patent: 2003/0107103 (2003-06-01), Iwata et al.
patent: 2003/0168712 (2003-09-01), Shin et al.
patent: 2004/0026746 (2004-02-01), Nakazawa et al.
patent: 2004/0032005 (2004-02-01), Williams et al.
patent: 2004/0033666 (2004-02-01), Williams et al.
patent: 2004/0071030 (2004-04-01), Goda et al.
patent: 2005/0014324 (2005-01-01), Williams et al.
patent: 2005/0014329 (2005-01-01), Williams et al.
patent: 2005/0087805 (2005-04-01), Ning
patent: 2005/0142724 (2005-06-01), Williams et al.
patent: 2005/0142791 (2005-06-01), Williams et al.
patent: 2005/0142792 (2005-06-01), Williams et al.
patent: 2005/0158939 (2005-07-01), Williams et al.
patent: 2005/0179093 (2005-08-01), Morris
patent: 2005/0179111 (2005-08-01), Chao
patent: 2005/0189606 (2005-09-01), Nakagawa
patent: 2005/0272207 (2005-12-01), Williams et al.
patent: 2005/0272230 (2005-12-01), Williams et al.
patent: 2005/0287765 (2005-12-01), Onai et al.
patent: 2006/0038237 (2006-02-01), Lotfi et al.
patent: 2006/0076629 (2006-04-01), Yilmaz
patent: 2006/0175635 (2006-08-01), Arai et al.
patent: 2006/0223257 (2006-10-01), Williams et al.
patent: 2006/0273403 (2006-12-01), Suzuki et al.
patent: 2007/0013021 (2007-01-01), Zhang
patent: 2007/0132056 (2007-06-01), Williams et al.
patent: 2007/0158779 (2007-07-01), Cannon et al.
patent: 2007/0241421 (2007-10-01), Liu et al.
patent: 2007/0278568 (2007-12-01), Williams et al.
patent: 2007/0278612 (2007-12-01), Williams et al.
patent: 2008/0042232 (2008-02-01), Williams et al.
patent: 2008/0044978 (2008-02-01), Williams et al.
patent: 2008/0048287 (2008-02-01), Williams et al.
patent: 2008/0191277 (2008-08-01), Disney et al.
patent: 2008/0197408 (2008-08-01), Disney et al.
patent: 2008/0197445 (2008-08-01), Disney et al.
patent: 2008/0197446 (2008-08-01), Disney et al.
patent: 2008/0210980 (2008-09-01), Disney et al.
patent: 2008/0217699 (2008-09-01), Disney et al.
patent: 2008/0230812 (2008-09-01), Disney et al.
patent: 2008/0237656 (2008-10-01), Williams et al.
patent: 2008/0237704 (2008-10-01), Williams et al.
patent: 2008/0237706 (2008-10-01), Williams et al.
patent: 2008/0237782 (2008-10-01), Williams et al.
patent: 2008/0237783 (2008-10-01), Williams et al.
patent: 2008/0290449 (2008-11-01), Williams et al.
patent: 2008/0290450 (2008-11-01), Williams et al.
patent: 2008/0290451 (2008-11-01), Williams et al.
patent: 2009/0020811 (2009-01-01), Voldman
patent: 2009/0101937 (2009-04-01), Lee et al.
patent: 2009/0236683 (2009-09-01), Williams et al.
patent: 0 589 675 (1994-03-01), None
patent: 1357598 (2003-10-01), None
patent: 2 362 508 (2001-11-01), None
patent: 10-0456691 (2008-11-01), None

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