Process variation detector and process variation detecting...

Details Process variation detector and process variation detecting... Process variation detector and process variation detecting...

2006-12-26

2006-12-26

Tsai, Carol S. W. (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C702S123000, C702S182000, C702S189000, C326S015000, C326S036000, C700S021000, C324S719000, C340S870030, C340S870030, C340S442000, C340S447000, C438S017000, C438S907000, C438S980000

Reexamination Certificate

active

07155360

ABSTRACT:
A process variation detector includes a pulse-signal generating unit that generates a pulse signal having a pulse width corresponding to a characteristic of a process variation in an integrated circuit based on a clock signal; and an output unit that generates a predetermined value, when the pulse signal indicates a specific process variation, by using a transistor of which a channel width and a gate length are set to an unbalanced state, and outputs the predetermined value.

REFERENCES:
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Patel et al., ‘A process and Technology-Tolerant IDDq Method for IC Diagnosis’, Jan. 2000, University of Maryland Publication, pp. 1-6.
Russell et al., ‘Determination of Spatial Variation of Interface Trapped Charge Using Short-Channel Mosfet's’, Jun. 9, 1983, IEEE Publication, pp. 1662-1671.
Xu et al., ‘IC -Integrated Flexible Shear-Stress Sensor Skin’, Jun. 2002, SSSAM Workshop, pp. 354-357.
Plusquellic et al., ‘Digital IC Device Testing by Transient Signal Analysis (TSA)’, Jan. 17, 1996, University of Pittsburg, pp. 1-8.

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