Process using tungsten for multilevel metallization

Coating processes – Electrical product produced – Condenser or capacitor

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427 93, 427 99, 427 91, H01L 21285

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046506969

ABSTRACT:
A process is provided for making semiconductor devices with refractory metal metallization layers in place of aluminum metallization layers. An insulative layer is deposited onto a silicon substrate and a pattern is formed in the insulative layer. Prior to deposition of the metallization layer onto the patterned insulative layer, a layer of polycrystalline silicon is deposited onto the patterned insulative layer by means of a low pressure chemical vapor deposition process. The polycrystalline silicon is deposited to a thickness of preferably 700-800 Angstroms. After deposition of the polycrystalline silicon layer, refractory metal is deposited by means of a low pressure chemical vapor deposition process. Preferably, the refractory metal is deposited to a thickness of one micrometer at a temperature of 300.degree.-600.degree. C. depending on the desired deposition rate. The refractory metal vapor deposition process etches away 300-400 Angstroms of the polysilicon layer, thereby leaving 300-400 Angstroms of polysilicon for the purpose of adhering the insulative layer to the refractory metal layer. The composite is then heat treated to reduce the vertical resistivity due to the pressure of the high resistance polycrystalline silicon layer.

REFERENCES:
patent: 3477872 (1969-11-01), Amick
patent: 3669724 (1972-06-01), Brand
patent: 3785862 (1974-01-01), Grill
patent: 3881242 (1975-05-01), Nuttall
patent: 4152823 (1979-05-01), Hall
patent: 4349408 (1982-09-01), Tarng
patent: 4356622 (1982-11-01), Widmann
patent: 4392299 (1983-07-01), Shaw
patent: 4404235 (1983-09-01), Tarng
patent: 4425700 (1984-01-01), Sasaki et al.
patent: 4441247 (1984-04-01), Gargini
patent: 4517225 (1985-05-01), Broadbent
patent: 4584207 (1986-04-01), Wilson
Morosanu et al, "Thin Film Preparation by Plasma and Low Pressure CVD in a Horizontal Reactor", Vacuum, vol. 31, No. 7, pp. 309 to 313 (1981).

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