Process tolerant, high-voltage, bi-level capacitance varactor di

Active solid-state devices (e.g. – transistors – solid-state diode – Voltage variable capacitance device – With specified dopant profile

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257595, 257615, 257657, H01L 2993

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active

055571409

ABSTRACT:
A doping profile is disclosed for realizing a varactor diode that exhibits a high breakdown voltage V.sub.BR, e.g.,>100 volts, and a capacitance which has a bi-level characteristic. In particular, the capacitance has a C.sub.max level and a C.sub.min level. The doping profile includes two lightly doped regions and, between them, a third region with higher doping. The doping concentrations and widths of the first two regions substantially set the tuning ratio of C.sub.max /C.sub.min, and the doping concentration and width of the third region substantially sets the transition voltage V.sub.TR between the bi-level capacitances.

REFERENCES:
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patent: 4868134 (1989-09-01), Kasahara
patent: 4876211 (1989-10-01), Kanber et al.
Norwood, Marcus H., et al., Voltage Variable Capacitor Tuning: A Review, Proceedings of the IEEE, vol. 56, No. 5, May, 1968.
Bogart, Theodore F., Electronic Devices and Circuits, MacMillan Publishing Company, New York, 1993, pp. 891-893.
Singh, Jasprit., Semiconductor Devices, McGraw-Hill, Inc., New York, 1994, pp. 192-208.
Sze, S. M., High-Speed Semiconductor Devices, Wiley-Interscience Publications, New York, 1990, pp. 539-544.

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