Process on thickness control for silicon-on-insulator technology

Fishing – trapping – and vermin destroying

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437 62, 437974, 148DIG12, 148DIG135, H01L 2176

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active

054496381

ABSTRACT:
A method for forming a thin, uniform top silicon layer using bonded-wafer SOI technology is described. A dielectric layer is formed on a first surface of a first silicon substrate. A trench is formed in a first surface of a second silicon substrate. A polishing stopper is formed in the trench. A second dielectric layer with a smooth top surface is formed over the polishing stopper and over the first surface of the second silicon substrate. The smooth top surface of the second dielectric layer of the second silicon substrate is bonded to the dielectric layer of the first silicon substrate. Material is removed from the exposed surface of the second silicon substrate to form the silicon layer with well-controlled thickness, having a top surface co-planar with the polishing stopper.

REFERENCES:
patent: 4501060 (1985-02-01), Frye et al.
patent: 4508757 (1985-04-01), Fabricius et al.
patent: 4784970 (1988-11-01), Solomon
patent: 4851366 (1989-07-01), Blanchard
patent: 4971925 (1990-11-01), Alexander et al.
patent: 5091330 (1992-02-01), Cambou et al.
patent: 5162254 (1992-11-01), Usui et al.
patent: 5183783 (1993-02-01), Ohta et al.
patent: 5238865 (1993-08-01), Eguchi
patent: 5268326 (1993-12-01), Lesk et al.
Becker et al., "Low Pressure Deposition of Doped SiO.sub.2 by Pyrolysis of Tetraethylorthosilicate (TEOS)"; J. Electrochem Soc.: Solid State Science and Technology, vol. 134, No. 11, 1987, pp. 2923-2931.
"Bonding & Etch-Back Silicon-On-Insulator" pp. 684-687, IEDM 1985.

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