Semiconductor device manufacturing: process – Making regenerative-type switching device – Having field effect structure
Patent
1995-06-19
1997-04-29
Bowers, Jr., Charles L.
Semiconductor device manufacturing: process
Making regenerative-type switching device
Having field effect structure
438589, H01L 21331
Patent
active
056248555
ABSTRACT:
An insulated-gate bipolar transistor includes a semiconductor region of a first conductive type; a base layer of a second conductive type diffused from a surface of the semiconductor region; a source layer of the first conductive type diffused in a surface portion of the base layer; an insulated gate buried in a recess dug from the surface of the source layer through the base layer up to the semiconductor region; a collector layer of the second conductive type diffused from a surface of the semiconductor region on an opposite side of the insulated gate with respect to the source layer; an emitter terminal drawn from the base layer and the source layer; a collector terminal drawn from the collector layer; and a gate terminal drawn from the insulated gate.
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B.-H. Lee et al., Jpn. J. Appl. Phys., 34 (2B) (1995) 854, "A trench-gate SOI lateral IGBT with p+ cathode well" Feb. 1995.
"Performance of 200 V CMOS Compatible Auxiliary Cathode Lateral Insulated Gate Transistors", Narayanan et al., IEEE, pp. 103-108, 1991.
Bowers Jr. Charles L.
Fuji Electric & Co., Ltd.
Radomsky Leon
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