Semiconductor device manufacturing: process – Chemical etching – Liquid phase etching
Reexamination Certificate
2006-11-21
2006-11-21
Norton, Nadine (Department: 1765)
Semiconductor device manufacturing: process
Chemical etching
Liquid phase etching
C438S754000, C252S079100, C252S079200, C252S079300, C252S079400
Reexamination Certificate
active
07138342
ABSTRACT:
Process for combined chemical cleaning and etching of parts made of aluminum and/or aluminum alloys including: (a) providing a cleaning and etching solution including 5–30 grams/liter of phosphoric acid; 5–30 grams/liter of hydrogen fluoride; 120–220 grams/liter of sulfamic acid; 55–85.0 grams/liter of glycol ether; and balance water; (b) contacting the parts with the solution for a time sufficient to achieve the desired amount of cleaning and etching; (c) periodically measuring the etching rate of the solution; (d) when the etching rate is below the required minimum rate, adding sufficient hydrogen fluoride to restore the etching rate above the required minimum rate; and (e) periodically adding sufficient sulfamic acid to prevent the formation of scale made of hydrated aluminum fluoride.
REFERENCES:
patent: 2941949 (1960-06-01), Saukaltis
patent: 3551122 (1970-12-01), Gulla
patent: 4000082 (1976-12-01), Otrhalek et al.
patent: 4191596 (1980-03-01), Dollman et al.
patent: 5271804 (1993-12-01), Muller et al.
patent: 5332452 (1994-07-01), Das
patent: 5634979 (1997-06-01), Carlson et al.
patent: 5669980 (1997-09-01), McNeil et al.
patent: 5700768 (1997-12-01), Lu
patent: 5750070 (1998-05-01), Tang et al.
patent: 6379980 (2002-04-01), Toprac
patent: 2002/0066465 (2002-06-01), Gotoh et al.
patent: 2002/0179263 (2002-12-01), Eng
patent: 2003/0015221 (2003-01-01), Wei et al.
patent: 1 277 830 (2003-01-01), None
patent: WO 2004/094581 (2004-11-01), None
Chang Cathleen H.
Tomt Terry C.
Norton Nadine
The Boeing Company
Umeez-Eronini Lynette T.
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