Process of maintaining hybrid etch

Semiconductor device manufacturing: process – Chemical etching – Liquid phase etching

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S754000, C252S079100, C252S079200, C252S079300, C252S079400

Reexamination Certificate

active

07138342

ABSTRACT:
Process for combined chemical cleaning and etching of parts made of aluminum and/or aluminum alloys including: (a) providing a cleaning and etching solution including 5–30 grams/liter of phosphoric acid; 5–30 grams/liter of hydrogen fluoride; 120–220 grams/liter of sulfamic acid; 55–85.0 grams/liter of glycol ether; and balance water; (b) contacting the parts with the solution for a time sufficient to achieve the desired amount of cleaning and etching; (c) periodically measuring the etching rate of the solution; (d) when the etching rate is below the required minimum rate, adding sufficient hydrogen fluoride to restore the etching rate above the required minimum rate; and (e) periodically adding sufficient sulfamic acid to prevent the formation of scale made of hydrated aluminum fluoride.

REFERENCES:
patent: 2941949 (1960-06-01), Saukaltis
patent: 3551122 (1970-12-01), Gulla
patent: 4000082 (1976-12-01), Otrhalek et al.
patent: 4191596 (1980-03-01), Dollman et al.
patent: 5271804 (1993-12-01), Muller et al.
patent: 5332452 (1994-07-01), Das
patent: 5634979 (1997-06-01), Carlson et al.
patent: 5669980 (1997-09-01), McNeil et al.
patent: 5700768 (1997-12-01), Lu
patent: 5750070 (1998-05-01), Tang et al.
patent: 6379980 (2002-04-01), Toprac
patent: 2002/0066465 (2002-06-01), Gotoh et al.
patent: 2002/0179263 (2002-12-01), Eng
patent: 2003/0015221 (2003-01-01), Wei et al.
patent: 1 277 830 (2003-01-01), None
patent: WO 2004/094581 (2004-11-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Process of maintaining hybrid etch does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Process of maintaining hybrid etch, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Process of maintaining hybrid etch will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3635789

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.