Process of final passivation of an integrated circuit device

Active solid-state devices (e.g. – transistors – solid-state diode – With means to control surface effects – Insulating coating

Reexamination Certificate

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C257S640000

Reexamination Certificate

active

06888225

ABSTRACT:
A process for forming a final passivation layer over an integrated circuit comprises a step of forming, over a surface of the integrated circuit, a protective film by means of High-Density Plasma Chemical Vapor Deposition.

REFERENCES:
patent: 5250843 (1993-10-01), Eichelberger
patent: 5605867 (1997-02-01), Sato et al.
patent: 5641546 (1997-06-01), Elwell et al.
patent: 5679606 (1997-10-01), Wang et al.
patent: 5750211 (1998-05-01), Weise et al.
patent: 5804259 (1998-09-01), Robles
patent: 5814564 (1998-09-01), Yao et al.
patent: 6117345 (2000-09-01), Liu et al.
patent: 6127285 (2000-10-01), Nag
patent: 0 611 129 (1994-08-01), None
patent: 0 887 847 (1998-12-01), None
patent: 06045313 (1994-02-01), None
Pye, J.T. et al., “High-Density Plasma CVD and CMP for 0.25 μm Internetal Dielectric Processing,”Solid State Technology, 38(12):65-71, Dec. 1995.

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