Process of fabricating target for calibrating and testing infrar

Metal working – Method of mechanical manufacture – Assembling or joining

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29611, 29460, B23P 2500

Patent

active

044803729

ABSTRACT:
Apparatus for calibrating and testing infrared detection devices is provided. The apparatus comprises a substrate which supports a target pattern of dielectric material which is at least partially absorbing to infrared radiation. A heater is used to supply heat to the substrate. Since the substrate and dielectric material have different emissivities, an apparent temperature difference is perceived by an IR detection device. As a consequence, temperature differences as low as about 0.02.degree. C. and below can be generated for calibrating and testing IR imaging devices.

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