Process monitor usig impedance controlled I/O controller

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36446828, 438 18, G01R 2700, G01R 3126, H01L 2100, H01L 2166

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active

056548958

ABSTRACT:
A process monitor and a method of using the same to determine the relative strength of a semiconductor fabrication process are disclosed. An impedance control output from an impedance controller circuit located on a semiconductor device is retrieved. Based upon a value of the retrieved impedance control output, the relative strength of the semiconductor fabrication process used to fabricate the semiconductor device is determined.

REFERENCES:
patent: 4743841 (1988-05-01), Takeuchi
patent: 4970454 (1990-11-01), Stambaugh et al.
patent: 5055715 (1991-10-01), Inaba
patent: 5068547 (1991-11-01), Gascoyne
patent: 5095267 (1992-03-01), Merrill et al.
patent: 5444637 (1995-08-01), Smesny et al.
patent: 5486786 (1996-01-01), Lee

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