Process monitor for monitoring an integrated circuit chip

Details Process monitor for monitoring an integrated circuit chip Process monitor for monitoring an integrated circuit chip

2008-10-30

2010-11-30

Hollington, Jermele M (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

07843205

ABSTRACT:
A system or apparatus for monitoring an Integrated Circuit (IC) chip includes: a sense circuit at least partially constructed on the IC chip and configured to produce one or more sense signals each indicative of a corresponding process-dependent circuit parameter of the IC chip; and a digitizer module configured to produce, responsive to the one or more sense signals, one or more digitized signals each representative of a corresponding one of the sense signals. A controller is configured to determine a value of one or more of the process-dependent circuit parameters based on one or more of the digitized signals.

REFERENCES:
patent: 4159514 (1979-06-01), Kakalec
patent: 4354216 (1982-10-01), Volta
patent: 4796142 (1989-01-01), Libert
patent: 5363048 (1994-11-01), Modlin et al.
patent: 5621355 (1997-04-01), Williams et al.
patent: 5677845 (1997-10-01), Staver et al.
patent: 5764655 (1998-06-01), Kirihata et al.
patent: 5774319 (1998-06-01), Carter et al.
patent: 5781766 (1998-07-01), Davis
patent: 5831446 (1998-11-01), So et al.
patent: 5939693 (1999-08-01), Roeckner et al.
patent: 6002356 (1999-12-01), Cooper
patent: 6040737 (2000-03-01), Ranjan et al.
patent: 6088806 (2000-07-01), Chee
patent: 6154715 (2000-11-01), Dinteman et al.
patent: 6163862 (2000-12-01), Adams et al.
patent: 6169442 (2001-01-01), Meehan et al.
patent: 6239603 (2001-05-01), Ukei et al.
patent: 6357025 (2002-03-01), Tuttle
patent: 6369618 (2002-04-01), Bloodworth et al.
patent: 6476593 (2002-11-01), Schmal et al.
patent: 6535013 (2003-03-01), Samaan
patent: 6577196 (2003-06-01), Hart
patent: 6600374 (2003-07-01), Nguyen et al.
patent: 6714036 (2004-03-01), Figueras et al.
patent: 6727759 (2004-04-01), Nguyen et al.
patent: 6769081 (2004-07-01), Parulkar
patent: 6785626 (2004-08-01), Corr
patent: 6853177 (2005-02-01), Shibayama et al.
patent: 6853315 (2005-02-01), Schiller et al.
patent: 6894501 (2005-05-01), Flasck et al.
patent: 7309998 (2007-12-01), Burns et al.
patent: 7385418 (2008-06-01), Speers et al.
patent: 7449908 (2008-11-01), Burns et al.
patent: 2002/0160711 (2002-10-01), Carlson et al.
patent: 2003/0034838 (2003-02-01), Fanous et al.
patent: 2004/0104740 (2004-06-01), Burns et al.
patent: 2004/0105033 (2004-06-01), Dauphinee et al.
patent: 2004/0108866 (2004-06-01), Burns et al.
patent: 2004/0166799 (2004-08-01), Kral
patent: 2005/0062491 (2005-03-01), Burns et al.
patent: 2005/0130617 (2005-06-01), Burns et al.
patent: 07183344 (1995-07-01), None
Allen, P. and Holberg, D., CMOSAnalog Circuit Design, Saunders College Publishing, 1987, pp. 58-66 and 76-86.
Johns, D. and Martin, K.,Analog Integrated Circuit Design, John Wiley & Sons, Inc., 1997 pp. 16-39 and 57-60.

Affiliated with

Also associated with

Rating

Process monitor for monitoring an integrated circuit chip does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Process monitor for monitoring an integrated circuit chip, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Process monitor for monitoring an integrated circuit chip will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4218118