Electric heating – Metal heating – By arc
Reexamination Certificate
2007-03-06
2007-03-06
Heinrich, Samuel M. (Department: 1725)
Electric heating
Metal heating
By arc
Reexamination Certificate
active
10403775
ABSTRACT:
A method for monitoring the processing of a workpiece includes directing an incident laser beam onto the workpiece and measuring a signal emitted from the workpiece. At least two signals are generated by a detector based upon the emitted signal. A workpiece processing quality is determined based upon the ratio of the two output signals and a magnitude of one of the two outputs.
REFERENCES:
patent: 3795918 (1974-03-01), Sunderland
patent: 3866484 (1975-02-01), Dreshman
patent: 3912242 (1975-10-01), Schoffmann
patent: 3918480 (1975-11-01), Leo
patent: 3929324 (1975-12-01), Lotz et al.
patent: 4003556 (1977-01-01), Roeder
patent: 4081215 (1978-03-01), Penney et al.
patent: 4101754 (1978-07-01), Fischer
patent: 4111404 (1978-09-01), Benko
patent: 4125250 (1978-11-01), Herbener et al.
patent: 4133988 (1979-01-01), Esibyan et al.
patent: 4143929 (1979-03-01), Boje et al.
patent: 4156125 (1979-05-01), Brown
patent: 4170727 (1979-10-01), Wilkins
patent: 4172586 (1979-10-01), Schmitt
patent: 4172587 (1979-10-01), Boje et al.
patent: 4180248 (1979-12-01), Benko
patent: 4202707 (1980-05-01), Hennecke
patent: 4225769 (1980-09-01), Wilkins
patent: 4251205 (1981-02-01), Roeder et al.
patent: 4305573 (1981-12-01), Boje et al.
patent: 4333635 (1982-06-01), Koukal
patent: 4363468 (1982-12-01), Noe
patent: 4410266 (1983-10-01), Seider
patent: 4444169 (1984-04-01), Kirisawa et al.
patent: 4466069 (1984-08-01), Balfanz
patent: 4475719 (1984-10-01), Lotz
patent: 4478393 (1984-10-01), Komma et al.
patent: 4527777 (1985-07-01), Lotz
patent: 4560856 (1985-12-01), Miller et al.
patent: 4602967 (1986-07-01), Komma et al.
patent: 4644173 (1987-02-01), Jeffers
patent: 4708493 (1987-11-01), Stein
patent: 4735399 (1988-04-01), Lotz
patent: 4742236 (1988-05-01), Kawakami et al.
patent: 4764669 (1988-08-01), Decker et al.
patent: 4775774 (1988-10-01), Caneer, Jr.
patent: 4814577 (1989-03-01), Dallavalle et al.
patent: 4817020 (1989-03-01), Chande et al.
patent: 4819658 (1989-04-01), Kolodner
patent: 4881823 (1989-11-01), Tanaka et al.
patent: 4996407 (1991-02-01), Traxler
patent: 5017752 (1991-05-01), Severance, Jr. et al.
patent: 5038016 (1991-08-01), Robertson et al.
patent: 5039837 (1991-08-01), Nourbakhsh et al.
patent: 5070227 (1991-12-01), Luo et al.
patent: 5071106 (1991-12-01), Helkenberg
patent: 5106201 (1992-04-01), Neuhaus
patent: 5166494 (1992-11-01), Luo et al.
patent: 5189277 (1993-02-01), Boisvert et al.
patent: 5225658 (1993-07-01), Yamaguchi et al.
patent: 5232196 (1993-08-01), Hutchings et al.
patent: 5262612 (1993-11-01), Momany et al.
patent: 5272312 (1993-12-01), Jurca
patent: 5288970 (1994-02-01), Nishi
patent: 5290995 (1994-03-01), Higgins et al.
patent: 5326955 (1994-07-01), Nishi et al.
patent: 5380976 (1995-01-01), Couch, Jr. et al.
patent: 5396043 (1995-03-01), Couch, Jr. et al.
patent: 5414236 (1995-05-01), Couch, Jr. et al.
patent: 5424507 (1995-06-01), Yamaguchi
patent: 5463202 (1995-10-01), Kurosawa et al.
patent: 5506386 (1996-04-01), Gross
patent: 5521350 (1996-05-01), Nishi et al.
patent: 5522424 (1996-06-01), Dalton, Jr. et al.
patent: 5591357 (1997-01-01), Couch, Jr. et al.
patent: 5614110 (1997-03-01), Shintani et al.
patent: 5638389 (1997-06-01), Nagano et al.
patent: 5653896 (1997-08-01), Couch, Jr. et al.
patent: 5695662 (1997-12-01), Couch, Jr. et al.
patent: 5717187 (1998-02-01), Rogozinski et al.
patent: 5756960 (1998-05-01), Rogozinski et al.
patent: 5801355 (1998-09-01), Saio et al.
patent: 5844196 (1998-12-01), Oakley
patent: 5866869 (1999-02-01), Schneider et al.
patent: 5866872 (1999-02-01), Lu et al.
patent: 5893986 (1999-04-01), Oakley et al.
patent: 6021682 (2000-02-01), Zeng
patent: 6028287 (2000-02-01), Passage et al.
patent: 6121570 (2000-09-01), Oakley et al.
patent: 6133543 (2000-10-01), Borowy et al.
patent: 6188041 (2001-02-01), Kim et al.
patent: 6239434 (2001-05-01), Brown
patent: 6274841 (2001-08-01), Ramakrishnan et al.
patent: 6332463 (2001-12-01), Farrugia et al.
patent: 6344625 (2002-02-01), Kim et al.
patent: 6346712 (2002-02-01), Popovic et al.
patent: 6350988 (2002-02-01), Brown
patent: 6359251 (2002-03-01), Picard et al.
patent: 6365868 (2002-04-01), Borowy et al.
patent: 6590181 (2003-07-01), Choo et al.
patent: 6642482 (2003-11-01), Rappl et al.
patent: 2002/0088783 (2002-07-01), Weber
patent: 2002/0125233 (2002-09-01), Horn et al.
patent: 2004/0129687 (2004-07-01), Yamaguchi et al.
patent: 0 2 203 194 (1973-04-01), None
patent: 0 370 967 (1990-05-01), None
patent: 0 370 967 (1990-05-01), None
patent: 0 437 226 (1991-07-01), None
patent: 0 437 226 (1991-07-01), None
patent: 0 437 226 (1991-07-01), None
patent: 1 161 126 (2001-12-01), None
patent: 359163089 (1984-09-01), None
patent: 363302432 (1988-12-01), None
patent: 405045278 (1993-02-01), None
patent: 408215868 (1996-08-01), None
patent: 408281456 (1996-10-01), None
patent: WO 00/41837 (2000-07-01), None
patent: WO 03/041903 (2003-05-01), None
Rogozinski, M.W. et al., “Development of a “Smart” Plasma Arc Cutting System” Electrical Engineering Congress, Nov. 24-30, 1994.
Hafe{dot over (r)}kamp, H. et al., “Quality Monitoring and Assurance for Laser Beam Cutting Using a Thermographic Process Control”SPIEvol. 3824 (Jun. 1999).
Miyamoto, I. et al., “Fundamental Study of In-Process Monitoring in Laser Cutting” 4thInternational Colloquium on Welding and Melting By Electronics and Laser Beam, Sep. 26-30, 1988.
Olsen, F. O. “Investigations in Methods for Adaptive Control of Laser Processing”Opto Electronic Magazinevol. 4, No. 2. (1988).
Zheng, H. Y., “The Use of Fibre Optics for In-Process Monitoring of Laser Cutting”ICALEOvol. 69 (1989).
Haferkamp, H. et al., “Quality Monitoring and Assurance for Laser Beam Cutting Using a Thermographic Process Control”SPIEvol. 3824 (Jun. 1999).
Connally William J.
Woods Kenneth J.
Heinrich Samuel M.
Hypertherm, Inc.
Proskauer Rose LLP
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