Process-invariant low-quiescent temperature detection circuit

Details Process-invariant low-quiescent temperature detection circuit Process-invariant low-quiescent temperature detection circuit

2007-12-19

2010-11-23

Caputo, Lisa M (Department: 2855)

Thermal measuring and testing

Temperature measurement

By electrical or magnetic heat sensor

C327S512000

Reexamination Certificate

active

07837384

ABSTRACT:
In one embodiment, an integrated circuit is provided for detecting when a temperature reaches a specified value. The circuit includes a differential circuit block having first and second transistors. A control terminal of the first transistor is coupled to a first voltage source, and a control terminal of the second transistor is coupled to a second voltage source. The second transistor has an area larger than the first transistor. The differential circuit block compares a first current flowing into the first transistor and a second current flowing into the second transistor. The differential circuit block outputs a signal to indicate that the specified temperature has been reached when the first current equals the second current according to specified values of the first voltage source, the second voltage source, and the ratio of the areas of the first and second transistors. A single-ended circuit block amplifies the output signal of the differential circuit block to a predetermined amplitude.

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