Process for the selective analysis of individual trace-like comp

Details Process for the selective analysis of individual trace-like comp Process for the selective analysis of individual trace-like comp

1982-06-14

1984-08-28

Turk, Arnold

Chemistry: analytical and immunological testing

Nuclear magnetic resonance, electron spin resonance or other...

250288, 436178, G01N 2408, H01J 4926

Patent

active

044684681

ABSTRACT:
The analysis comprises first enriching the component to be determined (target component) by contacting an non porous solid surface with the gas or the liquid to be investigated and depositing the target component from the gaseous or liquid phase onto the solid surface in the range of a monolayer preferably within the first monolayer. The deposition is effected by absorbing the target component either directly or in the form of a derivative product, which can then be detected by introducing the solid surface with the enriched target component into a mass spectrometer. Surface sensitive mass analyzers, such as secondary ion mass spectrometers or laser activated mass analyzers, have been proven successful.

REFERENCES:
patent: 3567927 (1971-03-01), Barrington
patent: 4023929 (1977-05-01), Becker et al.
patent: 4092116 (1978-05-01), Giaever
patent: 4220414 (1980-09-01), Barringer
patent: 4330208 (1982-05-01), Eloy
patent: 4378499 (1983-03-01), Spangler et al.
Posthumus et al., Analytical Chemistry, vol. 50, No. 7, Jun. 1978, pp. 985-991.
Smith et al., Analytical Chemistry, vol. 53, No. 11, Sep. 1981, pp. 1602-1611.

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