Process for the continuous, contact-free measurement of layer th

Details Process for the continuous, contact-free measurement of layer th Process for the continuous, contact-free measurement of layer th

1985-11-01

1988-10-25

Eisenzopf, Reinhard J.

Electricity: measuring and testing

A material property using electrostatic phenomenon

Corona induced

250325, 324 711, 73159, G01N 2760

Patent

active

047806800

ABSTRACT:
Disclosed is a process and apparatus for measuring, in a continuous and contact-free manner, the thickness of a layer applied to a support. The apparatus includes a measuring apparatus which comprises a corona and a first electrostatic voltmeter positioned downstream of the corona in the direction of travel of the layer being measured. The process includes the steps of passing the layer under the apparatus, charging the layer in a contact-free manner, and measuring the level of the charging voltage.

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Adhaesion 1980, Nr, 6m pp. 183-185, Dr. U. Zoll, Stuttgart "Measuring System for the Continuous Determination of Layer Thicknesses".

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