Process for revealing defects in testpieces using attenuated hig

Details Process for revealing defects in testpieces using attenuated hig Process for revealing defects in testpieces using attenuated hig

1995-05-12

1996-06-04

Porta, David P.

X-ray or gamma ray systems or devices

Specific application

Absorption

378185, 250337, G01B 1506

Patent

active

055241328

ABSTRACT:
A process and apparatus for revealing manufacturing defects in testpieces, such as printed circuit boards, by passing through high-intensity attenuated x-rays (above 150 Kilo-Volts) to reusable photo plates for revealing defects in the testpieces. The x-rays are angled from 35 to 50 degrees for generating images of defects within thick multilayered printed circuit boards. During exposure, a thin lead sheet is placed between the testpiece and a phosphor photographic plate on a side of the testpeice opposite the x-ray gun. The lead sheet uniformly attenuates the high-energy x-rays to the captured image before they reach the phosphor plate to avoid damage to the photographic reuse of the plate and prevent over-exposure without loss of image contrast in the phosphor photograph. The exposed phosphor plate is excited with a low energy monochromatic radiation to visually activate the latent x-ray image in the exposed plate. The activated image is received by an analog-to-digital converter which digitizes the image into digital signals that are formed into a data file. The data file of the digitized image is stored in a digital computer for display on a computer display device. Then, the image is erased by an ultra-violet lamp, and the phosphor plate is reused for later photographs of other boards. The data file provides a permanent way to maintain the visual quality of the x-ray captured image which would otherwise rapidly deteriorate.

REFERENCES:
patent: 3582653 (1971-06-01), Howard
patent: 3924127 (1974-12-01), Cheret et al.
patent: 4809308 (1989-02-01), Adams et al.
patent: 4926452 (1990-05-01), Baker et al.
patent: 4951305 (1990-08-01), Moore et al.
patent: 5311032 (1994-05-01), Montoro et al.
patent: 5357118 (1994-10-01), Fukuoka et al.
IEEE Transactions on Components, Packaging and Manufacturing Tech. Part B, vol. 17, No 3, Aug. 1994--"The Importance of Material Selection For . . . Assemblies" by G. O'Malley et al, pp. 248-255.

Affiliated with

Also associated with

Rating

Process for revealing defects in testpieces using attenuated hig does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Process for revealing defects in testpieces using attenuated hig, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Process for revealing defects in testpieces using attenuated hig will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-391021