Single-crystal – oriented-crystal – and epitaxy growth processes; – Processes of growth from liquid or supercritical state – Having pulling during growth
Reexamination Certificate
2008-05-23
2011-10-25
Pyon, Harold (Department: 1761)
Single-crystal, oriented-crystal, and epitaxy growth processes;
Processes of growth from liquid or supercritical state
Having pulling during growth
C117S011000, C117S013000, C117S019000, C117S073000, C117S074000
Reexamination Certificate
active
08043428
ABSTRACT:
In growing a silicon monocrystal from a silicon melt added with an N-type dopant by Czochralski method, the monocrystal is grown such that a relationship represented by a formula (1) as follows is satisfied. In the formula (1): a dopant concentration in the silicon melt is represented by C (atoms/cm3); an average temperature gradient of the grown monocrystal is represented by Gave(K/mm); a pulling-up speed is represented by V (mm/min); and a coefficient corresponding to a kind of the dopant is represented by A. By growing the silicon monocrystal under a condition shown in the left to a critical line G1, occurrence of abnormal growth due to compositional supercooling can be prevented.GaveV>A·C-43(1)
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Kawazoe Shinichi
Kubota Toshimichi
Narushima Yasuhito
Ogawa Fukuo
Holtz, Holtz, Goodman & Chick, P.C.
Nguyen Haidung
Pyon Harold
Sumco Techxiv Corporation
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