Process for production of silicon single crystal

Single-crystal – oriented-crystal – and epitaxy growth processes; – Processes of growth from liquid or supercritical state – Having pulling during growth

Reexamination Certificate

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C117S011000, C117S013000, C117S019000, C117S073000, C117S074000

Reexamination Certificate

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08043428

ABSTRACT:
In growing a silicon monocrystal from a silicon melt added with an N-type dopant by Czochralski method, the monocrystal is grown such that a relationship represented by a formula (1) as follows is satisfied. In the formula (1): a dopant concentration in the silicon melt is represented by C (atoms/cm3); an average temperature gradient of the grown monocrystal is represented by Gave(K/mm); a pulling-up speed is represented by V (mm/min); and a coefficient corresponding to a kind of the dopant is represented by A. By growing the silicon monocrystal under a condition shown in the left to a critical line G1, occurrence of abnormal growth due to compositional supercooling can be prevented.GaveV>A·C-43(1)

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International Preliminary Report on Patentability and Written Opinion (in English) issued on Jan. 12, 2010 in a counterpart International Application No. PCT/JP2008/059510.
Y. Shiraishi, et al., Prediction of solid-liquid interface shape during CZ Si crystal growth using experimental and global simulation. Elsevier, Journal of Crystal Growth 266, pp. 28-33, Feb. 26, 2004.
English Language International Search Report dated Jul. 1, 2008 issued in parent Appln. No. PCT/JP2008/059510.

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