Process for producing semiconductor article

Semiconductor device manufacturing: process – Bonding of plural semiconductor substrates

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438458, H01L 2130, H01L 2146

Patent

active

059666200

ABSTRACT:
A novel process for producing a semiconductor article is disclosed which comprises the steps of preparing a first substrate constituted of a silicon substrate, a nonporous semiconductor layer formed on the silicon substrate, and an ion implantation layer formed in at least one of the silicon substrate and the nonporous semiconductor layer; bonding the first substrate to a second substrate to obtain a multiple layer structure with the nonporous semiconductor layer placed inside; separating the multiple layer structure at the ion implantation layer; and removing the ion implantation layer remaining on the separated second substrate.

REFERENCES:
patent: 4816420 (1989-03-01), Bozler
patent: 5371037 (1994-12-01), Yonehara
patent: 5374564 (1994-12-01), Bruel
patent: 5374581 (1994-12-01), Ichikawa et al.
patent: 5559043 (1996-09-01), Bruel
patent: 5773355 (1998-06-01), Inoue et al.
patent: 5854123 (1998-12-01), Sato
M. Bruel, "Application of hydrogen ion beams to Silicon On Insulator material technology", Nucl. Instr. and Meth. in Phys. Res., vol. 108 (1996), pp. 313-319.
Q. Tong, "Semiconductor wafebonding: recent developments", Materials Chem. and Phys., vol. 37 (Mar. 1994), pp. 101-127.
Patent Abstracts of Japan, vol. 016, No. 166 (E-1193), Apr. 22, 1992 (JP 04-014705).
B. Aspar, "Transfer of structured and patterned thin silicon films using the Smart-Cut process", Elect. Letters, vol. 32 (Oct 10, 1996).
Imai, "Crystalline Quality of Silicon Layer Formed by FIPOS Technology", J. Crystal Growth, vol. 63, No. 3, pp. 547-553 (1983).
Maszara, "Silicon-On-Insulator by Wafer Bonding: A Review", J. Electrochem. Soc., vol. 138, No. 1, pp. 341-347 (1991).
Harendt, "Silicon on Insulator Material by Wafer Bonding", J. Elect. Mater., vol. 20, No. 3, pp. 267-277 (1991).
Baumgart, "Light Scattering Topography Characterization of Bonded SOI Wafers", Extended Abstract of ECS First International Symposium of Wafer Bonding, pp. 375-385 (1991).
Hunt, "Thinning of Bonded Wafers: Etch-Stop Approaches", Extended Abstract of ECS First International Symposium of Wafer Bonding, pp. 165-173 (1991).
Yonehara, "Epitaxial layer transfer by bond and etch back of porous Si", Appl. Phys. Lett., vol. 64, No. 16, pp. 2108-2110 (1994).

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