Semiconductor device manufacturing: process – Including control responsive to sensed condition – Electrical characteristic sensed
Reexamination Certificate
2006-01-31
2006-01-31
Lebentritt, Michael (Department: 2812)
Semiconductor device manufacturing: process
Including control responsive to sensed condition
Electrical characteristic sensed
C438S011000, C438S101000
Reexamination Certificate
active
06991943
ABSTRACT:
A method for adjusting the resistivity in the surface of a semiconductive substrate including selective measurement and counter-doping of areas on a major surface of a semiconductive substrate.
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Andoh Kohji
Chiola Davide
International Rectifier Corporation
Lebentritt Michael
Ostrolenk Faber Gerb & Soffen, LLP
Stevenson Andre′
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