Process for preparation of semiconductor wafer surface

Semiconductor device manufacturing: process – Including control responsive to sensed condition – Electrical characteristic sensed

Reexamination Certificate

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C438S011000, C438S101000

Reexamination Certificate

active

06991943

ABSTRACT:
A method for adjusting the resistivity in the surface of a semiconductive substrate including selective measurement and counter-doping of areas on a major surface of a semiconductive substrate.

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