Process for predicting propagation delay using linear interpolat

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

324532, 368120, 327 37, G04F 800

Patent

active

056315678

ABSTRACT:
According to the present invention, a process for use with automatic test equipment ("ATE") for determining a propagation delay in a semiconductor circuit is provided. In one embodiment of the invention, the process comprises the steps of determining an expected delay time by interpolating a first simulation capacitance, a second simulation capacitance, and an ATE capacitance, with a first simulated delay time and a second simulated delay time, the simulated delay times corresponding to the first and second simulated capacitances respectively, testing the semiconductor circuit with the ATE to determine an ATE delay time, and comparing the ATE delay time with the expected delay time to determine whether the propagation delay is acceptable.

REFERENCES:
patent: 4870629 (1989-09-01), Swerlein
patent: 5381100 (1995-01-01), Hayashi
patent: 5459402 (1995-10-01), Ueno
patent: 5488309 (1996-01-01), Farwell
patent: 5513152 (1996-04-01), Cabaniss

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Process for predicting propagation delay using linear interpolat does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Process for predicting propagation delay using linear interpolat, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Process for predicting propagation delay using linear interpolat will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1726393

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.