Optics: measuring and testing – For size of particles – By particle light scattering
Patent
1999-03-30
2000-07-18
Pham, Hoa Q.
Optics: measuring and testing
For size of particles
By particle light scattering
3562374, 702 29, G01N 2100
Patent
active
060914939
ABSTRACT:
The method of the present invention accurately measures the diameter of a particle resting on a surface through use of a beam of known wavelength being directed at the surface at an incident angle. Scattered light measurements are taken as the beam contacts the surface and the particle. Scattered light measurements are separated into their respective P and S power components. During all measurements, the beam source remains constant in that it is not moved or adjusted for intensity or polarization. The P and S power components of the background measurements are subtracted from the P and S power components of the particle measurements to give net P and S power components. From the net P and S power components the net P and S components of the differential scatter cross section may be derived as is known in the art. Different ratios may be formed from the differential scatter cross section to eliminate many of the intensity errors inherent in the use of scattered light measurements. These ratios are sensitive to particle diameter but insensitive to absolute light measurements.
A model, known in the art for its accuracy, is used to calculate scattered light of the particle. The model results are used to form the same ratios as a function of particle diameter and are then compared to the ratios from the measured data. Based on this comparison, the diameter of the spherical particle is determined.
REFERENCES:
patent: 4242673 (1980-12-01), Cooper
patent: 5801824 (1998-09-01), Henley
patent: 5801965 (1998-09-01), Takagi et al.
patent: 5909276 (1999-06-01), Kinney et al.
patent: 5936726 (1999-08-01), Takeda et al.
Scheer Craig A.
Stover John C.
Pham Hoa Q.
Scatter Works, Inc.
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