Thermal measuring and testing – Temperature measurement – In spaced noncontact relationship to specimen
Patent
1992-12-10
1994-06-28
Cuchlinski, Jr., William A.
Thermal measuring and testing
Temperature measurement
In spaced noncontact relationship to specimen
374109, 364420, G01J 502, G01W 110
Patent
active
053241134
ABSTRACT:
A method of estimating both atmospheric conditions and surface temperatures of an object from either a single set of multispectral images or multiple simultaneously-acquired single-band images of the object. Estimates of atmospheric conditions are generated by determining and radiometrically correcting radiance values measured from the image of the object. Expected radiance values are then determined and compared with the measured radiance values. The best fit of the radiance values measured from the image of the object to the expected radiance values corresponds to the best estimate of the atmospheric conditions associated with the object. The present method estimates atmospheric conditions for the object regardless of the availability of atmospheric conditions associated with the image.
REFERENCES:
patent: 3702735 (1972-11-01), Potter, Jr.
patent: 4420265 (1983-12-01), Everest et al.
patent: 4661907 (1987-04-01), Arnone et al.
patent: 5160842 (1992-11-01), Johnson
"Surface reflectance measurements in the UV from an airborne platform, Part 1", D. D. Doda and A. E. S. Green, Applied Optics, vol. 19, No. 13, Jul. 1, 1980.
Givens Fenton L.
Ingram, Jr. Paul M.
Johnson James R.
Bennett G. Bradley
Cuchlinski Jr. William A.
E-Systems Inc.
Meier Harold E.
LandOfFree
Process for multispectral/multilook atmospheric estimation does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Process for multispectral/multilook atmospheric estimation, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Process for multispectral/multilook atmospheric estimation will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2373887